GB/T 4339-1999 Replaced National standards

GB/T 4339-1999 Testing method for thermal expansion characteristic parameters of metallic materials

Publish Date: 1999-11-01 Implement Date: 2000-08-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 4339-1999

Standard Type: National standards

Standard Status: Replaced

is_force_gb: no

CCS Name: \nTest methods for the physical properties of metals

ICS Name: Comprehensive Testing of Metal Materials

Publish Date: 1999-11-01

Implement Date: 2000-08-01

Pages: 16 pages

Development Information

Word Count: 24 Thousand words Pages: 16 pages

Replace the following standards

GB 4339-1984

Superseded by the following standards

GB/T 4339-2008 Test methods for thermal expansion characteristic parameters of metallic materials

Referenced Standards

GB/T 8170-1987 Rules for rounding off of numberical values GB/T 10562-1989 Metallic material—Standard test method for the extra-low expansion coefficient—Light interferometer method JJG 141-1988 JJG 229-1987 JJG 351-1984

Adopt standards

ASTM E 228-1995

Related Standards

GB/T 14140.1-1993 Replaced

GB/T 14140.1-1993 Silicon slices and wafers—Measuring of diameter—Optical projecting method

Publish Date: 1993-02-06

GB/T 14140.2-1993 Replaced

GB/T 14140.2-1993 Silicon slices and wafers—Measuring of diameter—Micrometer method

Publish Date: 1993-02-06

GB/T 15615-1995 Abolished

GB/T 15615-1995 Test method for measuring flexure strength of silicon slices

Publish Date: 1995-07-12

GB/T 16481-1996 Abolished

GB/T 16481-1996 Standard spectrum tables of microwave plasma torch-atomic emitting spectrum of rare earth

Publish Date: 1996-07-09

GB/T 1550-1997 Replaced

GB/T 1550-1997 Standard methods for measuring conductivity type of extrinsic semiconducting materials

Publish Date: 1997-06-03

GB/T 1553-1997 Replaced

GB/T 1553-1997 Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay

Publish Date: 1997-06-03