GB/T 4937.9-2026 Active National standards

GB/T 4937.9-2026 Semiconductor devices—Mechanical and climatic test methods—Part 9:Permanence of marking

GB/T 4937.9-2026 Semiconductor devices—Mechanical and climatic test methods—Part 9:Permanence of marking

Publish Date: 2026-02-27 Implement Date: 2026-09-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us
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Basic Information

Standard Code: GB/T 4937.9-2026
Standard Type: National standards
Standard Status: Active
is_force_gb: no
CCS Name: Semiconductor discrete devices
ICS Name: Integrated Components of Semiconductor Devices
Publish Date: 2026-02-27
Implement Date: 2026-09-01
Pages: 12 pages

Scope

The purpose of this document is to determine whether the markings on solid-state semiconductor devices remain clear after the application and removal of labels, or after the use of solvents and cleaning fluids (commonly used to remove solder residue in the manufacturing process of printed circuit boards).
This document applies to all packaging types and is used for identification and/or process monitoring. This test is non-destructive, and electrical or mechanical damage can be used as criteria for evaluating the results of this test.
Note 1: This test is not applicable to laser marking.
Many available solvents are either insufficiently effective, subject to strict regulatory controls, or pose a danger to humans upon direct contact or inhalation of fumes.
Note 2: The solvent components used in this test are considered typical and representative compared to commonly used coatings and markings.

Development Information

Word Count: 15 Thousand words Pages: 12 pages

Same series standard

Adopt standards

IEC 60749-9:2017

Related Standards

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