GB/T 43088-2023 Active National standards

GB/T 43088-2023 Microbeam analysis—Analytical electron microscopy—Measurement of the dislocation density in thin metals

GB/T 43088-2023 Microbeam analysis—Analytical electron microscopy—Measurement of the dislocation density in thin metals

Publish Date: 2023-09-07 Implement Date: 2024-04-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 43088-2023

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Basic standards and general methods

ICS Name: Physicochemical analysis methods

Publish Date: 2023-09-07

Implement Date: 2024-04-01

Pages: 24 pages

Scope

This document specifies the equipment, samples, measurement methods, data processing, uncertainty of measurement results, and test reports for measuring the dislocation density in metal thin crystals using transmission electron microscopy (TEM). This document is applicable to measuring dislocation densities of no more than 1×1015 m-2 within grains. It is also suitable for measuring the dislocation densities within individual grains of metal thin crystal samples with thicknesses ranging from tens of nanometers to hundreds of nanometers.

Development Information

Word Count: 48 Thousand words Pages: 24 pages

Referenced Standards

GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction GB/T 40300-2021 Microbeam analysis—Analytical electron microscopy—Vocabulary

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