GB/T 46567.1-2025 Active National standards

GB/T 46567.1-2025 Intelligent computing—Test method for memristor—Part 1:Basic characteristics

GB/T 46567.1-2025 Intelligent computing—Test method for memristor—Part 1:Basic characteristics

Publish Date: 2025-10-31 Implement Date: 2025-10-31 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us
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Basic Information

Standard Code: GB/T 46567.1-2025
Standard Type: National standards
Standard Status: Active
is_force_gb: no
CCS Name: Semiconductor discrete devices
ICS Name: Other discrete semiconductor devices
Publish Date: 2025-10-31
Implement Date: 2025-10-31
Pages: 20 pages

Scope

This document specifies the requirements for memristor testing devices and environmental conditions, describes the testing methods for basic characteristics such as memristor reading, electrical pre-processing, enhancement, and suppression, and stipulates the requirements for testing reports.
This document is applicable to the testing of basic characteristics such as reading, electrical pre-processing, enhancement, and suppression of two-terminal bipolar memristors.

Development Information

Word Count: 25 Thousand words Pages: 20 pages

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