GB/T 32817-2016 Semiconductor devices—Micro-electromechanical devices—Generic specification for MEMS

GB/T 2423.55-2023 Environmental testing—Part 2:Test methods—Test Eh:Hammer tests GB/T 2423.56-2006 Environmental testing for electric and electronic products—Part 2:Test methods—Test Fh:Vibration, broad-band random(digital control)and guidance GB/T 2423.56-2018 Environmental testing—Part 2:Test methods—Test Fh:Vibration, broadband random and guidance GB/T 2423.56-2023 Environmental testing—Part 2:Test methods—Test Fh:Vibration,broadband random and guidance GB/T 2423.57-2008 Environmental testing for electric and electronic products—Part 2:Tests—Test Ei:Shock—Shock response spectrum synthesis GB/T 2423.58-2008 Environmental testing for electric and electronic products—Part 2:Tests methods—Test Fi:Vibration—Mixed Mode GB/T 2423.59-2008 Environmental testing for electric and electronic products—Part 2:Test methods—Test Z/ABMFh:Combined temperature(cold and heat)/low air pressure/vibration(random) GB/T 2423.60-2008 Environmental testing for electric and electronic products—Part 2:Test methods—Test U:Robustness of terminations and integral mounting devices GB/T 2423.61-2018 Environmental testing—Part 2:Test methods—Test and guidance:Dust and sand test for large specimen GB/T 2423.62-2018 Environmental testing—Part 2:Test motheds—Test Fx and guidance:Mulit input mulit output vibration test GB/T 2423.63-2019 Environmental testing—Part 2:Test methods—Test:combined temperature(cold and heat)/low air pressure/vibration(mixed mode) GB/T 2423.64-2023 Environmental testing—Part 2:Test methods—Test Fj:Vibration—Long time history replication GB/T 2423.65-2024 Environmental testing—Part 2:Test methods—Test:Combined salt mist/temperature/humidity/solar radiation GB/T 2423.66-2025 Environmental testing—Part 2:Test methods—Test:Combined temperature/humidity/static load GB/T 2423.101-2008 Environmental testing for electric and electronic products—Part 2:Test methods—Test:Inclinations and swings GB/T 2423.101-2025 Environmental testing—Part 2:Test methods—Test:Inclinations and swings GB/T 2423.102-2008 Environmental testing for electric and electronic products—Part 2:Test methods—Test: combined temperature(cold and heat)/low air pressure/vibration(sinusoidal) GB/T 2424.1-2005 Environmental testing for electric and electronic products—Guidance for high temperature and low temperature tests GB/T 2424.1-2015 Environmental testing—Part 3:Supporting documentation and guidance—Cold and dry heat tests GB/T 2424.2-1993 Basic environmental testing procedures for electric and electronic products Guidance for damp heat tests GB/T 2424.2-2005 Environment tests for electric and electronic products—Guidance for damp heat tests GB/T 2424.5-2006 Environmental tests for electric and electronic products—Confirmation of the performance of temperature chambers GB/T 2424.5-2021 Environmental testing—Part 3:Supporting documentation and guidance—Confirmation of the performance of temperature chambers GB/T 2424.6-2006 Environmental testing for electric and electronic products—Confirmation of the performance of temperature/humidity chambers GB/T 2424.6-2021 Environmental testing—Part 3: Supporting documentation and guidance—Confirmation of the performance of temperature/humidity chambers GB/T 2424.7-2006 Environmental tests for electric and electronic products—Measurements in temperature chambers for tests A and tests B (with load) GB/T 2424.7-2024 Environmental testing—Part 3:Supporting documentation and guidance—Meas-urements in temperature chambers for tests A(Cold)and B(Dry heat)(with load) GB/T 2424.10-1993 Basic environmental testing procedures for electric and electronic products—General guidance of accelerated testing for atmospheric corrosion GB/T 2424.10-2012 Environmental testing—General guidance of accelerated testing for atmospheric corrosion GB/T 2424.11-2013 Environmental testing—Part 2:Test methods—Guidance to test Kc:Sulphur dioxide test for contacts and connections GB/T 2424.12-2014 Environmental testing—Part 2:Test methods—Guidance to test Kd:Hydrogen sulphide test for contacts and connections GB/T 2424.13-2002 Environmental testing for electric and electronic products—Part 2:Test methods—Guidance on change of temperature tests GB/T 2424.14-1995 Environmental testing for electric and electronic products—Part 2:Test methods—Guidance for solar radiation testing GB/T 2424.15-1992 Basic enviromental testing procedures for electric and electronic products Guide for combined temperature/low air pressure tests GB/T 2424.15-2008 Environmental testing for electric and electronic products—Guide for combined temperature/low air pressure tests GB/T 2424.17-1995 Environmental testing for electric and electronic products—Guidance on soldering test GB/T 2424.17-2008 Environmental testing for electric and electronic products—Part 2:Tests methods Guidance on test T:Soldering test GB/T 2424.19-2005 Environment tests for electric and electronic products—Guidance on the application of the environmental test to simulate the effects of storage GB/T 2424.22-1986 Basic environmental testing procedures for electric and electronic products Guidance for combined temperature (cold and heat) vibration (sinusoidal) tests GB/T 2424.23-1990 Basic environmental test procedures for electric and electronic products Guidance for water test GB/T 2424.24-1995 Basic environmental testing procedures for electric and electronic products Guidance for combined temperature(cold and heat)/low air pressure/vibration (sinusoidal)test GB/T 2424.25-2000 Environmental testing for electric and electronic products—Part 3:Test guidance-Seismic test methods GB/T 2424.25-2024 Environmental testing—Part 3:Test guidance—Seismic test methods GB/T 2424.26-2008 Environmental testing for electric and electronic products—Part 3:Supporting documentation and guidance—Selecting amongst vibration tests GB/T 2424.27-2013 Environmental testing—Supporting documentation and guidance—Calculation of uncertainty of conditions in climatic test chambers GB/T 2828.1-2003 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection GB/T 2828.1-2012 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection GB 3100-1993 SI units and recommendations for the use of their multiples and of certain other units GB/T 4728.1-2005 Graphical symbols for electrical diagrams—Part 1:General information GB/T 4728.1-2018 Graphical symbols for electrical diagrams—Part 1:General information GB/T 4728.2-1998 Graphical symbols for diagrams—Part 2 Symbol elements,qualifying symbols and other symbols having general application GB/T 4728.2-2005 Graphical symbols for electrical diagrams—Part 2:Symbol elements,qualifying symbols and other symbols having general application GB/T 4728.2-2018 Graphical symbols for electrical diagrams—Part 2:Symbol elements,qualifying symbols and other symbols having general application GB/T 4728.3-1998 Graphical symbols for diagrams—Part 3 Conductors and connecting devices GB/T 4728.3-2005 Graphical symbols for electrical diagrams—Part 3:Conductors and connecting devices GB/T 4728.3-2018 Graphical symbols for electrical diagrams—Part 3:Conductors and connecting devices GB/T 4728.4-1999 Graphical symbols for diagrams—Part 4:Basic passive components GB/T 4728.4-2005 Graphical symbols for electrical diagrams—Part 4:Basic passive components GB/T 4728.4-2018 Graphical symbols for electrical diagrams—Part 4:Basic passive components GB/T 4728.5-2000 Graphical symbols for diagrams—Part 5:Semiconductors and electron tubes GB/T 4728.5-2005 Graphical symbols for electrical diagrams—Part 5:Semiconductors and electron tubes GB/T 4728.5-2018 Graphical symbols for electrical diagrams—Part 5:Semiconductors and electron tubes GB/T 4728.6-2000 Graphical symbols for diagrams—Part 6:Production and conversion of electrical energy GB/T 4728.6-2008 Graphical symbols for diagrams—Part 6:Production and conversion of electrical energy GB/T 4728.6-2022 Graphical symbols for electrical diagrams—Part 6:Production and conversion of electrical energy GB/T 4728.7-2000 Graphical symbols for diagrams—Part 7:Switchgear,controlgear and protective devices GB/T 4728.7-2008 Graphical symbols for diagrams—Part 7:Switchgear,controlgear and protective devices GB/T 4728.7-2022 Graphical symbols for electrical diagrams—Part 7:Switchgear,controlgear and protective devices GB/T 4728.8-2000 Graphical symbols for diagrams—Part 8:Measuring instruments,lamps and signalling devices GB/T 4728.8-2008 Graphical symbols for diagrams—Part 8:Measuring instruments,lamps and signaling devices GB/T 4728.8-2022 Graphical symbols for electrical diagrams—Part 8:Measuring instruments,lamps and signalling devices GB/T 4728.9-1999 Graphical symbols for diagrams—Part 9:Telecommunications:Switching and peripheral equipment GB/T 4728.9-2008 Graphical symbols for diagrams—Part 9:Telecommunications:Switching and peripheral equipment GB/T 4728.9-2022 Graphical symbols for electrical diagrams—Part 9:Telecommunications:Switching and peripheral equipment GB/T 4728.10-1999 Graphical symbols for diagrams—Part 10:Telecommunications:Transmission GB/T 4728.10-2008 Graphical symbols for diagrams—Part 10:Telecommunications:Transmission GB/T 4728.10-2022 Graphical symbols for electrical diagrams—Part 10:Telecommunications:Transmission GB/T 4728.11-2000 Graphical symbols for diagrams—Part 11:Architectural and topographical installation plans and diagrams GB/T 4728.11-2008 Graphical symbols for diagrams—Part 11:Architectural and topographical installation plans and diagrams GB/T 4728.11-2022 Graphical symbols for electrical diagrams—Part 11:Architectural and topographical GB/T 4728.12-1996 Graphical symbols for electrical diagrams—Part 12:Binary logic elements GB/T 4728.12-2008 Graphical symbols for diagrams—Part 12:Binary logic elements GB/T 4728.12-2022 Graphical symbols for electrical diagrams—Part 12:Binary logic elements GB/T 4728.13-1996 Graphical symbols for electrical diagrams Part 13:Analogue elements GB/T 4728.13-2008 Graphical symbols for diagrams—Part 13:Analogue elements GB/T 4728.13-2022 Graphical symbols for electrical diagrams—Part 13:Analogue elements GB/T 4937-1995 Mechanical and climatic test methods for semiconductor devices GB/T 4937.1-2006 Semiconductor devices—Mechanical and climatic test methods—Part 1:General GB/T 4937.2-2006 Semiconductor devices—Mechanical and climatic test methods—Part 2:Low air pressure GB/T 4937.3-2012 Semiconductor devices—Mechanical and climatic tests methods—Part 3:External visual examination GB/T 4937.4-2012 Semiconductor devices—Mechanical and climatic test methods—Part 4:Damp heat,steady state,highly accelerated stress test(HAST) GB/T 4937.8-2025 Semiconductor devices—Mechanical and climatic test methods—Part 8:Sealing GB/T 4937.9-2026 Semiconductor devices—Mechanical and climatic test methods—Part 9:Permanence of marking GB/T 4937.10-2025 Semiconductor devices—Mechanical and climatic tests methods—Part 10:Mechanical Shock—Device and subassembly GB/T 4937.11-2018 Semiconductor devices—Mechanical and climatic test methods—Part 11:Rapid change of temperature—Two-fluid-bath method GB/T 4937.12-2018 Semiconductor devices—Mechanical and climatic test methods—Part 12:Vibration,variable frequency GB/T 4937.13-2018 Semiconductor devices—Mechanical and climatic test methods—Part 13:Salt atmosphere GB/T 4937.14-2018 Semiconductor devices—Mechanical and climatic test methods—Part 14:Robustness of terminations(lead integrity） GB/T 4937.15-2018 Semiconductor devices—Mechanical and climatic test methods—Part 15:Resistance to soldering temperature for through-hole mounted devices GB/T 4937.16-2025 Semiconductor devices—Mechanical and climatic test methods—Part 16:Particle impact noise detection(PIND) GB/T 4937.17-2018 Semiconductor devices—Mechanical and climatic test methods—Part 17:Neutron irradiation GB/T 4937.18-2018 Semiconductor devices—Mechanical and climatic test methods—Part 18:Ionizing radiation(total dose) GB/T 4937.19-2018 Semiconductor devices—Mechanical and climatic test methods—Part 19:Die shear strength GB/T 4937.20-2018 Semiconductor devices—Mechanical and climatic test methods—Part 20:Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat GB/T 4937.21-2018 Semiconductor devices—Mechanical and climatic test methods—Part 21:Solderability GB/T 4937.22-2018 Semiconductor devices—Mechanical and climatic test methods—Part 22:Bond strength GB/T 4937.23-2023 Semiconductor devices—Mechanical and climatic test methods—Part 23:High temperature operating life GB/T 4937.24-2025 Semiconductor devices—Mechanical and climatic test methods—Part 24:Accelerated moisture resistance—Unbiased HAST GB/T 4937.25-2025 Semiconductor devices—Mechanical and climatic test methods—Part 25:Temperature cycling GB/T 4937.26-2023 Semiconductor devices—Mechanical and climate test methods—Part 26:Electrostatic discharge(ESD)sensitivity testing—Human body model(HBM) GB/T 4937.27-2023 Semiconductor devices—Mechanical and climatic test methods—Part 27:Electrostatic discharge (ESD) sensitivity testing—Machine model (MM) GB/T 4937.28-2026 Semiconductor devices—Mechanical and climate test methods—Part 28:Electrostatic discharge(ESD)sensitivity testing—Charged device model(CDM)—device level GB/T 4937.29-2025 Semiconductor devices—Mechanical and climatic test methods—Part 29:Latch-up test GB/T 4937.30-2018 Semiconductor devices—Mechanical and climatic test methods—Part 30:Preconditioning of non-hermetic surface mount devices prior to reliability testing GB/T 4937.31-2023 Semiconductor devices—Mechanical and climatic test methods—Part 31:Flammability of platic-encapsulated devices(internally induced) GB/T 4937.32-2023 Semiconductor devices—Mechanical and climatic test methods—Part 32:Flammability of platic-encapsulated devices(externally induced) GB/T 4937.33-2025 Semiconductor devices—Mechanical and climatic test methods—Part 33:Accelerated moisture resistance—Unbiased autoclave GB/T 4937.34-2024 Semiconductor devices—Mechanical and climatic test methods—Part 34: Power cycling GB/T 4937.35-2024 Semiconductor devices—Mechanical and climatic test methods—Part 35:Acoustic microscopy for plastic encapsulated electronic components GB/T 4937.36-2025 Semiconductor devices—Mechanical and climatic test methods—Part 36:Acceleration,steady state GB/T 4937.37-2025 Semiconductor devices—Mechanical and climatic test methods—Part 37:Board level drop test method using an accelerometer GB/T 4937.38-2025 Semiconductor devices—Mechanical and climatic test methods—Part 38:Soft error test method for semiconductor devices with memory GB/T 4937.39-2025 Semiconductor devices—Mechanical and climatic test methods—Part 39:Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components GB/T 4937.40-2025 Semiconductor devices—Mechanical and climatic test methods—Part 40:Board level drop test method using a strain gauge GB/T 4937.41-2026 Semiconductor devices—Mechanical and climatic test methods—Part 41:Test method for reliability of non-volatile memory devices GB/T 4937.42-2023 Semiconductor devices—Mechanical and climatic test methods—Part 42:Temperature and humidity storage GB/T 4937.44-2025 Semiconductor devices—Mechanical and climatic test methods—Part 44:Neutron beam irradiated single event effect(SEE) test method for semiconductor devices GB/T 4937.201-2018 Semiconductor devices—Mechanical and climatic test methods—Part 20-1:Handling,packing,labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat GB/T 26111-2010 Micro-electromechanical system technology—Terms GB/T 26111-2023 Micro-electromechanical system technology—Terms IEC 60027(所有部分) IEC 60747-1:2006 IEC 61193-2 IECQ 03-3:2013

IEC 62047-4:2008