GB/T 43883-2024 Microbeam analysis—Analytical electron microscopy—Method for determining the number density of nanoparticles in a metal

Scope

This document describes a method for determining the number density of nanoscale second-phase particles in metal materials using transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) techniques. This document is applicable to determining the number density of second-phase particles that are dispersed and have a particle size ranging from several nanometers to tens of nanometers in metal materials. The average size of the particles being measured should be less than approximately one-third of the thickness of the TEM sample, and the particles in the sample should not overlap or only slightly overlap each other in the TEM image. Samples with particle sizes outside this range can be measured as a reference, and other crystalline materials can also be measured as a reference. This method is not suitable for determining the number density of second-phase particles that have aggregated into clusters. Note 1: The minimum particle size that can be measured depends on the resolution of the TEM/STEM equipment used and the experimental techniques employed. Note 2: The size of the second-phase particles to be measured is typically in the range of 5 nm to 40 nm. Note 3: If second-phase particles overlap in the TEM image, the uncertainty of particle counting will increase.

Development Information

Referenced Standards

Related Standards