GB/T 11093-1989
Replaced
GB/T 32573-2016
Active
National standards
GB/T 32573-2016 Silicon powder—Determination of total carbon content—Infrared absorption method after combustion in an induction furnace
GB/T 32573-2016 Silicon powder—Determination of total carbon content—Infrared absorption method after combustion in an induction furnace
Basic Information
Standard Code:
GB/T 32573-2016
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Element semiconductor materials
ICS Name:
Semiconductor materials
Publish Date:
2016-02-24
Implement Date:
2016-11-01
Pages:
9 pages
Scope
This standard specifies the method for determining the total carbon content in silicon powder by infrared absorption after combustion in an induction furnace.
This standard is applicable to the determination of the total carbon content in silicon powder, which is a raw material for the production of polycrystalline silicon. The measurement range is 0.001% to 1.0% (by mass fraction).
Development Information
Referenced Standards
GB/T 6379.2-2004 Accuracy(trueness and precision)of measurement methods and results—Part 2:Basic method for the determination of repeatability and reproducibility of a standard measurement method
GB/T 6682-2008 Water for analytical laboratory use—Specification and test methods
YS/T 724-2009 Metallurgical silicon powder
YB/T 4145
JJG 395-1997 Carbon-Sulfur Analyzer
JJG 395-2016 Carbon-sulfur Analyzers
Related Standards
GB/T 13388-1992
Replaced
GB/T 13388-1992 Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques
GB/T 13389-1992
Replaced
GB/T 13389-1992 Practice for conversion between resistivity and dopant density for boron-doped and phosphorus-doped silicon
GB/T 13843-1992
Abolished
GB/T 13843-1992 Polished monocrystalline sapphire substrates
GB/T 14015-1992
Active
GB/T 14015-1992 Silicon on sapphire epitaxial wafers
GB/T 14139-1993
Replaced