YS/T 724-2009 Replaced Industry standards-Non-ferrous metals

YS/T 724-2009 Metallurgical silicon powder

YS/T 724-2009 Metallurgical silicon powder

Publish Date: 2009-12-04 Implement Date: 2010-06-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: YS/T 724-2009

Standard Type: Industry standards

Standard Status: Replaced

is_force_gb: no

CCS Name: Semi-metal

ICS Name: Semiconductor materials

Publish Date: 2009-12-04

Implement Date: 2010-06-01

Pages: 5 pages

Scope

This standard specifies the requirements, test methods, inspection rules, and packaging, marking, transportation, storage, and the content of purchase orders (or contracts) for silica powder.
This standard applies to silica powder produced by crushing and screening industrial silica generated by melting with carbon-based reducing agents in a mineral heat furnace, which is mainly used as a raw material for the production of polycrystalline silicon.

Development Information

Word Count: 6 Thousand words Pages: 5 pages

Superseded by the following standards

YS/T 724-2016 Silicon power for polycrystalline

Referenced Standards

GB/T 14849.1-1993 Silicon metal—Determination of iron content—1,10-Phenanthroline spectrophotometric method GB/T 14849.1-2007 Methods for chemical analysis of silicon metal—Part 1:Determination of iron content—1,10-Phenanthrolion spectrophotometric method GB/T 14849.1-2020 Methods for chemical analysis of silicon metal—Part 1:Determination of iron content GB/T 14849.2-1993 Silicon metal—Determination of aluminum content—Chrome azurol S spectrophotometric method GB/T 14849.2-2007 Methods for chemical analysis of silicon metal—Part 2:Determination of aluminum content—Chrome azurol S spectrophotometric method GB/T 14849.3-1993 Silicon metal—Determination of calcium content GB/T 14849.3-2007 Methods for chemical analysis of silicon metal—Part 3:Determination of calcium content GB/T 14849.3-2020 Methods for chemical analysis of silicon metal—Part 3:Determination of calcium content GB/T 14849.4-2008 Methods for chemical analysis of silicon metal—Part 4:Determination of elements content Inductively coupled plasma atomic emission spectrometric method GB/T 14849.4-2014 Methods for chemical analysis of silicon metal—Part 4:Determination of impurity contents—Inductively coupled plasma atomic emission spectrometric method

Related Standards

GB/T 11093-1989 Replaced

GB/T 11093-1989 Liquid encapsulated czochralski-grown gallium arsenide single crystals and As-cut slices

Publish Date: 1989-03-31

GB/T 13388-1992 Replaced

GB/T 13388-1992 Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques

Publish Date: 1992-02-19

GB/T 13389-1992 Replaced

GB/T 13389-1992 Practice for conversion between resistivity and dopant density for boron-doped and phosphorus-doped silicon

Publish Date: 1992-02-19

GB/T 13843-1992 Abolished

GB/T 13843-1992 Polished monocrystalline sapphire substrates

Publish Date: 1992-12-28

GB/T 14015-1992 Active

GB/T 14015-1992 Silicon on sapphire epitaxial wafers

Publish Date: 1992-12-28

GB/T 14139-1993 Replaced

GB/T 14139-1993 Silicon epitaxial wafers

Publish Date: 1993-02-06