GB/T 4855-1984
Abolished
GB/T 44797-2025
Active
National standards
GB/T 44797-2025 Microwave hybrid integrated circuits—Synthesized frequency sources
GB/T 44797-2025 Microwave hybrid integrated circuits—Synthesized frequency sources
Price:
$ 54
Basic Information
Standard Code:
GB/T 44797-2025
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
\nMembrane integrated circuit
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2025-01-24
Implement Date:
2025-01-24
Pages:
16 pages
Scope
This document specifies the definition, technical requirements, and inspection rules for synthetic frequency sources, as well as their marking, and describes the testing methods.
This document is applicable to synthetic frequency sources designed and manufactured using microwave hybrid integrated circuit technology.
Development Information
Referenced Standards
GB/T 2423.1-2008 Environmental testing for electric and electronic products—Part 2:Test methods—Tests A:Cold
GB/T 2423.2-2008 Environmental testing for electric and electronic products—Part 2:Test methods—Tests B:Dry heat
GB/T 4937.3-2012 Semiconductor devices—Mechanical and climatic tests methods—Part 3:External visual examination
GB/T 4937.21-2018 Semiconductor devices—Mechanical and climatic test methods—Part 21:Solderability
GB/T 8976-1996 Generic specification for film integrated circuits and hybrid film integrated circuits
GB/T 9178-1988 Terminology for integrated circuits
GB/T 11498-2018 Semiconductor devices—Integrated circuits—Part 21:Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures
GB/T 13062-2018 Semiconductor devices—Integrated circuits—Part 21-1:Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures
GB/T 35002-2018 Microwave circuits—Measuring methods for frequency source
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished