GB/T 11093-1989
Replaced
GB/T 8756-2018
Active
National standards
GB/T 8756-2018 Collection of metallographs on defects of germanium crystal
GB/T 8756-2018 Collection of metallographs on defects of germanium crystal
Basic Information
Standard Code:
GB/T 8756-2018
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semi-metals and semiconductor materials
ICS Name:
Semiconductor materials
Publish Date:
2018-12-28
Implement Date:
2019-07-01
Pages:
39 pages
Scope
This standard specifies the defects generated during the preparation and mechanical processing of germanium polycrystals and germanium single crystals, and provides the characteristics, causes, and elimination methods of various defects. This standard applies to defects generated during the production of zone-melted germanium ingots, germanium single crystals, germanium grinding slices, and germanium polishing slices.
Development Information
Replace the following standards
Referenced Standards
Related Standards
GB/T 13388-1992
Replaced
GB/T 13388-1992 Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques
GB/T 13389-1992
Replaced
GB/T 13389-1992 Practice for conversion between resistivity and dopant density for boron-doped and phosphorus-doped silicon
GB/T 13843-1992
Abolished
GB/T 13843-1992 Polished monocrystalline sapphire substrates
GB/T 14015-1992
Active
GB/T 14015-1992 Silicon on sapphire epitaxial wafers
GB/T 14139-1993
Replaced