MT/T 707-1997
Active
GB/T 25189-2010
Active
National standards
GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
Basic Information
Standard Code:
GB/T 25189-2010
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Electrochemical, thermochemical, and optical analytical instruments
ICS Name:
Other standards related to analytical chemistry
Publish Date:
2010-09-26
Implement Date:
2011-08-01
Pages:
8 pages
Scope
This standard specifies the measurement methods for the quantitative analysis of chemical components in scanning electron microscopes (SEMs).
This standard is applicable to the measurement of relevant parameters that affect the quantitative analysis performance in SEMs and the basic parameters of the spectrometers. It also conducts a comprehensive analysis of the instrument based on the results of the quantitative analysis of elemental components.
Development Information
Referenced Standards
GB/T 17359-1998 General specification of X-ray EDS Quantitative analysis for EPMA and SEM
GB/T 4930-1993 General specification of electron probe microanalysis standard specimen
GB/T 4930-2008 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials(CRMs)
GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials(CRMs)
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
GB/T 20726-2015 Microbeam analysis—Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
JJF 1001-1998 General Terms in Metrology and Their Definitions
JJF 1001-2011 General Terms in Metrology and Their Definitions
GB/T 20726-2025 Microbeam analysis—Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers(EDS)for use with a scanning electron microscope (SEM)or an electron probe microanalyser(EPMA)
Related Standards
GB/T 20724-2006
Replaced
GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
GB/T 20725-2006
Active
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 20726-2006
Replaced
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
LY/T 1082-2008
Replaced
LY/T 1082-2008 Test method for analysis of vegetable tannin extracts
LY/T 1083-2008
Replaced