MT/T 707-1997
Active
GB/T 20726-2025
Active
National standards
GB/T 20726-2025 Microbeam analysis—Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers(EDS)for use with a scanning electron microscope (SEM)or an electron probe microanalyser(EPMA)
GB/T 20726-2025 Microbeam analysis—Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers(EDS)for use with a scanning electron microscope (SEM)or an electron probe microanalyser(EPMA)
Basic Information
Standard Code:
GB/T 20726-2025
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Electronic optics and other physical optical instruments
ICS Name:
Other standards related to analytical chemistry
Publish Date:
2025-08-29
Implement Date:
2026-03-01
Publisher:
国家市场监督管理总局、国家标准化管理委员会
Technical Committee:
全国微束分析标准化技术委员会(SAC/TC 38)
Pages:
20 pages
Scope
本文件规定了以半导体探测器、前置放大器和信号处理系统为基本构成的X射线能谱仪最重要的特性参数。
本文件仅适用于使用基于固态电离原理的半导体探测器能谱仪。
本文件规定了与扫描电子显微镜(SEM)或电子探针显微分析仪(EPMA)联用的此类能谱仪性能参数的最低要求及核查方法。用于能谱分析的程序,已由ISO 22309[2]和ASTM E1508[3]规范,不在本文件范围之内。
Development Information
Drafting Units:
中国科学院地质与地球物理研究所、核工业北京地质研究院、中国科学院化学研究所
Drafting Persons:
毛骞、范光、王岩华、曾荣树、原江燕
Replace the following standards
Referenced Standards
ISO 22493
ISO 23833
Adopt standards
ISO 15623:2021
Related Standards
GB/T 20724-2006
Replaced
GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
GB/T 20725-2006
Active
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 20726-2006
Replaced
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
LY/T 1082-2008
Replaced
LY/T 1082-2008 Test method for analysis of vegetable tannin extracts
LY/T 1083-2008
Replaced