MT/T 707-1997
Active
GB/T 15617-2025
Active
National standards
GB/T 15617-2025 Microbeam analysis—Electron probe microanalysis—Quantitative analysis of silicate minerals
GB/T 15617-2025 Microbeam analysis—Electron probe microanalysis—Quantitative analysis of silicate minerals
Basic Information
Standard Code:
GB/T 15617-2025
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Electrochemical, thermochemical, and optical analytical instruments
ICS Name:
Other standards related to analytical chemistry
Publish Date:
2025-08-29
Implement Date:
2026-03-01
Pages:
12 pages
Scope
This document describes the quantitative analysis method of natural silicate minerals under electron beam irradiation using an electron probe microanalyzer.
This document is applicable to natural silicate minerals, as well as artificially synthesized silicate materials and other oxygen-containing salts, such as phosphates and sulfates, and oxide minerals and materials.
This document is suitable for quantitative analysis using an electron probe microanalyzer, as well as for quantitative analysis using a scanning electron microscope equipped with a spectrometer.
Development Information
Replace the following standards
Referenced Standards
GB/T 4930-1993 General specification of electron probe microanalysis standard specimen
GB/T 4930-2008 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials(CRMs)
GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials(CRMs)
GB/T 15074-1994 General guide for EPMA quantitative analysis
GB/T 15074-2008 General guide of quantitative analysis by EPMA
GB/T 15074-2025 General specification for EPMA quantitative analysis
GB/T 17366-1998 Methods of mineral and rock specimen preparation for EPMA
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 20725-2025 Microbeam analysis—Electron probe microanalysis—Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 21636-2008 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary
GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis(EPMA)—Vocabulary
GB/T 43889-2024 Microbeam analysis—Electron probe microanalyser(EPMA)—Guidelines for performing quality assurance procedures
GB/T 17366-2025 Microbeam analysis—Electron probe microanalysis—Methods of specimen preparation for minerals and rocks
Related Standards
GB/T 20724-2006
Replaced
GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
GB/T 20725-2006
Active
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 20726-2006
Replaced
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
LY/T 1082-2008
Replaced
LY/T 1082-2008 Test method for analysis of vegetable tannin extracts
LY/T 1083-2008
Replaced