GB/T 11093-1989
Replaced
GB/T 8646-1998
abolished_transferred
National standards
GB/T 8646-1998 Fine aluminum-1% silicon wire for semiconductor lend-bonding
GB/T 8646-1998 Fine aluminum-1% silicon wire for semiconductor lend-bonding
Basic Information
Standard Code:
GB/T 8646-1998
Standard Type:
National standards
Standard Status:
abolished_transferred
is_force_gb:
no
CCS Name:
Semi-metal
ICS Name:
Semiconductor materials
Publish Date:
1998-07-15
Implement Date:
1999-02-01
Pages:
8 pages
Development Information
Replace the following standards
GB 8646-1988
Superseded by the following standards
Referenced Standards
GB/T 191-90
GB 6987.1~6987.21-86
GB 6987.1~6987.21-86
GB 6987.1~6987.21-86
GB 6987.1~6987.21-86
GB 6987.1~6987.21-86
GB 6987.1~6987.21-86
GB 6987.1~6987.21-86
GB 6987.1~6987.21-86
GB 6987.1~6987.21-86
GB 6987.1~6987.21-86
GB 6987.1~6987.21-86
GB 6987.1~6987.21-86
GB 6987.1~6987.21-86
GB 6987.1~6987.21-86
GB 6987.1~6987.21-86
GB 6987.1~6987.21-86
GB 6987.1~6987.21-86
GB 6987.1~6987.21-86
GB 6987.1~6987.21-86
GB 6987.1~6987.21-86
GB 6987.1~6987.21-86
GB/T 8750-1997 Gold wire for semiconductor devices lead bonding
GB/T 10573-89
GB/T 15077-94
SJ/T 10705-96
Adopt standards
ASTM F487-88
Related Standards
GB/T 13388-1992
Replaced
GB/T 13388-1992 Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques
GB/T 13389-1992
Replaced
GB/T 13389-1992 Practice for conversion between resistivity and dopant density for boron-doped and phosphorus-doped silicon
GB/T 13843-1992
Abolished
GB/T 13843-1992 Polished monocrystalline sapphire substrates
GB/T 14015-1992
Active
GB/T 14015-1992 Silicon on sapphire epitaxial wafers
GB/T 14139-1993
Replaced