YS/T 985-2014 Polished reclaimed silicon wafers
YS/T 985-2014 Polished reclaimed silicon wafers
Basic Information
Scope
This standard specifies the requirements, inspection methods, inspection rules, marking, packaging, transportation, storage, quality certificates, and order forms (or contracts) for silicon polishing recovery wafers.
This standard applies to silicon recovery wafers provided by users or sourced from third parties (mainly including 100 mm, 125 mm, 150 mm, and 200 mm single-sided or double-sided polished silicon wafers, unpolished silicon wafers, or epitaxial silicon wafers) prepared by single-sided polishing. The products are mainly used for monitoring in machinery, furnace processing, particle detection, and lithography. Additionally, users need to pay attention to the thermal history, body contamination, and surface deposits of silicon recovery wafers.