GB/T 31352-2014 Active National standards

GB/T 31352-2014 Test methods for warp of sapphire substrates

Publish Date: 2014-12-31 Implement Date: 2015-09-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 31352-2014

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: \nTest methods for the physical properties of metals

ICS Name: Other testing methods for metal materials

Publish Date: 2014-12-31

Implement Date: 2015-09-01

Pages: 7 pages

Scope

This standard specifies the test method for the warpage of sapphire cutting discs, grinding discs, and polishing discs (hereinafter referred to as sapphire substrate discs).
This standard is applicable to the warpage test of sapphire substrate discs with a diameter of 50.8 mm to 304.8 mm and a thickness of not less than 200 μm.

Development Information

Word Count: 13 Thousand words Pages: 7 pages

Referenced Standards

GB/T 2828.1-2003 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection GB/T 2828.1-2012 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection GB/T 6620-1995 Test method for measuring warp on silicon slices by noncontact scanning GB/T 6620-2009 Test method for measuring warp on silicon slices by noncontact scanning GB/T 14264-1993 Semiconductor materials—Terms and definitions GB/T 14264-2009 Semiconductor materials—Terms and definitions GB/T 14264-2024 Terminology of semiconductor materials

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