SJ/T 11552-2015 Active Industry standards-Electronics

SJ/T 11552-2015 Using Brewster angle to measure the content of silicon interstitial oxygen using P-polarized radiation and infrared absorption spectroscopy

Publish Date: 2015-10-10 Implement Date: 2016-04-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: SJ/T 11552-2015

Standard Type: Industry standards

Standard Status: Active

is_force_gb: no

CCS Name: Element semiconductor materials

ICS Name: Semiconductor materials

Publish Date: 2015-10-10

Implement Date: 2016-04-01

Pages: 8 pages

Development Information

Pages: 8 pages

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