GB/T 3655-2000 Replaced National standards

GB/T 3655-2000 Methods of measurement of the magnetic properties of electrical steel sheet and strip by means of an Epstein frame

Publish Date: 2000-10-25 Implement Date: 2001-09-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 3655-2000

Standard Type: National standards

Standard Status: Replaced

is_force_gb: no

CCS Name: \nTest methods for the physical properties of metals

ICS Name: Comprehensive Testing of Metal Materials

Publish Date: 2000-10-25

Implement Date: 2001-09-01

Pages: 16 pages

Development Information

Word Count: 26 Thousand words Pages: 16 pages

Replace the following standards

GB 3655-1992

Superseded by the following standards

GB/T 3655-2008 Methods of measurement of the magnetic properties of electrical steel sheet and strip by means of an Epstein frame

Referenced Standards

GB/T 2521-1996 Cold-rolled grain-oriented and non-oriented magnetic steel strip(sheet) GB/T 5212-1985 Hot rolled silicon steel sheets for electrical grade GB/T 10129-1988

Adopt standards

IEC 404-2:1996

Related Standards

GB/T 14140.1-1993 Replaced

GB/T 14140.1-1993 Silicon slices and wafers—Measuring of diameter—Optical projecting method

Publish Date: 1993-02-06

GB/T 14140.2-1993 Replaced

GB/T 14140.2-1993 Silicon slices and wafers—Measuring of diameter—Micrometer method

Publish Date: 1993-02-06

GB/T 15615-1995 Abolished

GB/T 15615-1995 Test method for measuring flexure strength of silicon slices

Publish Date: 1995-07-12

GB/T 16481-1996 Abolished

GB/T 16481-1996 Standard spectrum tables of microwave plasma torch-atomic emitting spectrum of rare earth

Publish Date: 1996-07-09

GB/T 1550-1997 Replaced

GB/T 1550-1997 Standard methods for measuring conductivity type of extrinsic semiconducting materials

Publish Date: 1997-06-03

GB/T 1553-1997 Replaced

GB/T 1553-1997 Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay

Publish Date: 1997-06-03