GB/T 2413-1981
Active
GB/T 46379-2025
Active
National standards
GB/T 46379-2025 Bismaleimide triazine (BT) base material for integrated circuit (IC) package
GB/T 46379-2025 Bismaleimide triazine (BT) base material for integrated circuit (IC) package
Price:
$ 44.00
Basic Information
Standard Code:
GB/T 46379-2025
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Electronic devices and specialized materials, parts, and structural components
ICS Name:
Special materials for electronic technology
Publish Date:
2025-10-31
Implement Date:
2026-02-01
Pages:
20 pages
Scope
This document specifies the product classification, materials, requirements, quality assurance, packaging and labeling, transportation, and storage of double-sided copper foil encapsulation substrates using bis-maleimide triazine (BT) as the main resin, with an insulation layer thickness of 0.015 mm to 3.2 mm. Other printed circuit copper foil laminates used for encapsulation substrates may be used as reference.
Development Information
Referenced Standards
GB/T 2036-1994 Terms for printed circuits
GB/T 4721-2021 General rules for rigid copper clad laminates for printed circuits
GB/T 4722-2017 Test methods for rigid copper clad laminates for printed circuits board
GB/T 5230-1995 Electrodeposited copper foil
GB/T 5230-2020 Electrodeposited copper foil for printed board
GB/T 18373-2001 E-glass fabric woven for printed boards
GB/T 18373-2013 E-glass fabric woven for printed boards
GB/T 43801-2024 Measurement of relative permittivity and loss tangent for copper clad laminate at microwave frequency—Split post dielectric resonator method
SJ/T 10668-2023 SJ/T 10668-2023 Electronic Assembly Technology Terminology
SJ/T 10668-1995 Terminology for surface mount technology
Related Standards
GB/T 3389.4-1982
Replaced
GB/T 3389.4-1982 Test methods for the properties of piezoelectric ceramics—Longitudinal length extension vibration mode for rod
GB/T 5594.1-1985
Active
GB/T 5594.1-1985 Test methods for properties of structure ceramic used in electronic components—Test method for gas-tightness
GB/T 5594.2-1985
Active
GB/T 5594.2-1985 Test methods for properties of structure ceramic used in electronic components—Test method for Youngs elastic modulus and Poisson ratio
GB/T 5594.3-1985
Replaced
GB/T 5594.3-1985 Test methods for properties of structure ceramic used in electronic components—Test method for mean coefficient of linear expansion
GB/T 5594.4-1985
Replaced