GB/T 2596-1981
Abolished
GB/T 4058-1995
Replaced
National standards
GB/T 4058-1995 Test method for detection of oxidation induced defects in polished silicon wafers
GB/T 4058-1995 Test method for detection of oxidation induced defects in polished silicon wafers
Basic Information
Standard Code:
GB/T 4058-1995
Standard Type:
National standards
Standard Status:
Replaced
is_force_gb:
no
CCS Name:
Non-destructive testing methods for metals
ICS Name:
Chemical analysis of metal materials
Publish Date:
1995-04-18
Implement Date:
1995-12-01
Pages:
12 pages
Development Information
Replace the following standards
GB 4058-1983
GB 6622-1986
GB 6623-1986
Superseded by the following standards
Referenced Standards
Adopt standards
ASTM F47-1988
Related Standards
GB/T 3249-1982
Replaced
GB/T 3249-1982 Standard method for determination of particle size of powders of refractory metals and compounds—Fisher method
GB/T 3488-1983
Replaced
GB/T 3488-1983 Hardmetals—metallographic determination of microstructure
GB/T 3489-1983
Replaced
GB/T 3489-1983 Hardmetals—Metallographic determination of porosity and uncombined carbon
GB/T 3651-1983
Replaced
GB/T 3651-1983 Measuring method for thermal conductivity of metal at high temperature
GB/T 4059-1983
Replaced