GB/T 1554-1995 Replaced National standards

GB/T 1554-1995 Test method for crystallographic perfection of silicon by preferential etch techniques

Publish Date: 1995-04-18 Implement Date: 1995-12-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 1554-1995

Standard Type: National standards

Standard Status: Replaced

is_force_gb: no

CCS Name: Non-destructive testing methods for metals

ICS Name: Comprehensive, terminology, standardization, literature

Publish Date: 1995-04-18

Implement Date: 1995-12-01

Pages: 12 pages

Development Information

Word Count: 20 Thousand words Pages: 12 pages

Replace the following standards

GB 1554-1979 GB 4057-1983

Superseded by the following standards

GB/T 1554-2009 Testing method for crystallographic perfection of silicon by preferential etch techniques

Referenced Standards

YS/T 209 GB/T 4058-1995 Test method for detection of oxidation induced defects in polished silicon wafers GB/T 4058-2009 Test method for detection of oxidation induced defects in polished silicon wafers

Adopt standards

ASTM F47-88

Related Standards

GB/T 2882-1981 Replaced

GB/T 2882-1981 Nickel and nickel-copper alloy tube

Publish Date: 1981-12-30

GB/T 3089-1982 Replaced

GB/T 3089-1982 Thinnest-wall seamless tubes of stainless and acid-resistance steel

Publish Date: 1982-05-10

GB/T 3359-1982 Replaced

GB/T 3359-1982 Statistical interpretation of data—Determination of a statistical tolerance interval

Publish Date: 1982-12-30

GB/T 3360-1982 Abolished

GB/T 3360-1982 Statistical interpretation of data—Estimation of the mean—Confidence interval

Publish Date: 1982-12-30

GB/T 3361-1982 Active

GB/T 3361-1982 Statistical interpretation of data Comparison of two means in the case of paired observations

Publish Date: 1982-12-30

GB/T 3458-1982 Replaced

GB/T 3458-1982 Technical requirements of tungsten powders

Publish Date: 1982-12-31