T/IAWBS 017-2022 Active Group standards

T/IAWBS 017-2022 The testing method for half-width of the double-crystal waviness of diamond single crystal using X-ray diffraction

Publish Date: 2022-12-15 Implement Date: 2022-12-22 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: T/IAWBS 017-2022

Standard Type: Group standards

Standard Status: Active

is_force_gb: no

CCS Name: -

ICS Name: Semiconductor materials

Publish Date: 2022-12-15

Implement Date: 2022-12-22

Scope

Scope: This document specifies the method of testing the half-peak width of the swing curve of diamond single crystals using a double-crystal X-ray diffractometer. This document is applicable to diamond single crystals grown by high-temperature high-pressure method, chemical vapor deposition method, and other methods. Samples of the aforementioned single crystals that have undergone chemical or mechanical polishing are also suitable for this method. Main technical content: This standard, based on the material performance characteristics of diamond single crystals and combined with the current research level of diamond crystal quality detection technology in China, specifies the testing principles, measurement accuracy assurance, and measurement steps of the X-ray double-crystal swing curve of diamond single crystals. This standard is divided into 11 chapters, with the main content including: scope, normative references, terms and definitions, testing principles, testing instruments and calibration, testing samples, interference factors, testing environment, testing procedures, precision, testing reports, and appendices.