DB32/T 4378-2022 Active Jiangsu ProvinceLocal standards

DB32/T 4378-2022 The non-destructive testing of the bulk resistance of thin films on the surface of the substrate at nanometer and sub-micrometer scales using four-probe method

DB32/T 4378-2022 The non-destructive testing of the bulk resistance of thin films on the surface of the substrate at nanometer and sub-micrometer scales using four-probe method

Publish Date: 2022-10-23 Implement Date: 2022-11-23 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: DB32/T 4378-2022
Standard Type: Local standards
Standard Status: Active
is_force_gb: no
CCS Name: Seeds, seedlings, and nurseries
ICS Name: \nGreening and afforestation
Publish Date: 2022-10-23
Implement Date: 2022-11-23
Pages: 12 pages

Scope

This document specifies a method for non-destructive four-probe testing of thin-film square resistance on the surface of substrates using conductive rubber probes. This document is applicable to the determination of square resistance for samples with visually flat surfaces and nano- and sub-micron-scale thin films, with a square resistance testing range of 1×10-4 Ω to 1×104 Ω.

Development Information

Word Count: 18 Thousand words Pages: 12 pages

Referenced Standards

Related Standards

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