GB/T 11093-1989
Replaced
YS/T 1160-2016
Active
Industry standards-Non-ferrous metals
YS/T 1160-2016 Silicon powder-quantitative phase analysis—Determination of silicon dioxide content—Value K method of X-ray diffraction
YS/T 1160-2016 Silicon powder-quantitative phase analysis—Determination of silicon dioxide content—Value K method of X-ray diffraction
Basic Information
Standard Code:
YS/T 1160-2016
Standard Type:
Industry standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Analysis methods for light metals and their alloys
ICS Name:
Semiconductor materials
Publish Date:
2016-07-11
Implement Date:
2017-01-01
Pages:
6 pages
Scope
This standard specifies the method for determining the silica content in industrial silica powder.
This standard is applicable to the determination of the silica content in industrial silica powder, with a measurement range of ≥1%.
Development Information
Referenced Standards
Related Standards
GB/T 13388-1992
Replaced
GB/T 13388-1992 Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques
GB/T 13389-1992
Replaced
GB/T 13389-1992 Practice for conversion between resistivity and dopant density for boron-doped and phosphorus-doped silicon
GB/T 13843-1992
Abolished
GB/T 13843-1992 Polished monocrystalline sapphire substrates
GB/T 14015-1992
Active
GB/T 14015-1992 Silicon on sapphire epitaxial wafers
GB/T 14139-1993
Replaced