GB/T 29851-2013 Active National standards

GB/T 29851-2013 Test method for measuring boron and aluminium in silicon materials used for photovoltaic applications by secondary ion mass spectrometry

GB/T 29851-2013 Test method for measuring boron and aluminium in silicon materials used for photovoltaic applications by secondary ion mass spectrometry

Publish Date: 2013-11-12 Implement Date: 2014-04-15 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 29851-2013
Standard Type: National standards
Standard Status: Active
is_force_gb: no
CCS Name: Element semiconductor materials
ICS Name: Semiconductor materials
Publish Date: 2013-11-12
Implement Date: 2014-04-15
Pages: 6 pages

Scope

This standard specifies the method for determining the boron and aluminum content in silicon materials for photovoltaic cells using secondary ion mass spectrometers (SIMS).
This standard is applicable to the quantitative analysis of the boron and aluminum content in silicon materials for photovoltaic cells, where the concentrations of boron and aluminum are both greater than 1×1013 atoms/cm3. The measurement of other acceptor impurities can also refer to this standard.

Development Information

Word Count: 10 Thousand words Pages: 6 pages

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