GB/T 15678-1995
Replaced
GB/T 17472-2022
Active
National standards
GB/T 17472-2022 Specification for pastes of precious metal used for microelectronics
GB/T 17472-2022 Specification for pastes of precious metal used for microelectronics
Basic Information
Standard Code:
GB/T 17472-2022
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Precious metals and their alloys
ICS Name:
Other non-ferrous metal products
Publish Date:
2022-10-12
Implement Date:
2023-05-01
Pages:
9 pages
Scope
This document specifies the classification, technical requirements, test methods, inspection rules, marking, packaging, transportation, storage, and accompanying documents and order forms for precious metal pastes used in microelectronics technology.
This document applies to sintered and cured precious metal pastes used in microelectronics technology (hereinafter referred to as "pastes"). Non-precious metal pastes can also be implemented as a reference.
Development Information
Replace the following standards
Referenced Standards
GB/T 6739-1996 Determination of film hardness by pencil test
GB/T 6739-2006 Paints and varnishes—Determination of film hardness by pencil test
GB/T 6739-2022 Paints and varnishes—Determination of film hardness by pencil test
GB/T 13452.2-1992 Paints and varnishes—Determination of film thickness
GB/T 13452.2-2008 Paints and varnishes—Determination of film thickness
GB/T 17473.1-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of solids content
GB/T 17473.1-2008 Test methods of precious metals pastes used for microelectronics—Determination of solids content
GB/T 17473.2-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of fineness
GB/T 17473.2-2008 Test methods of precious metals pastes used for microelectronics—Determination of fineness
GB/T 17473.3-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of sheet resistance
GB/T 17473.3-2008 Test methods of precious metals pastes used for microelectronics—Determination of sheet resistance
GB/T 17473.4-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of adhesion
GB/T 17473.4-2008 Test methods of precious metals pastes used for microelectronics—Determination of adhesion
GB/T 17473.5-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of viscosity
GB/T 17473.5-2008 Test methods of precious metals pastes used for microelectronics—Determination of viscosity
GB/T 17473.6-1998 Test methods of precious metal pastes used for thick-film microelectronics—Determination of resolution
GB/T 17473.6-2008 Test methods of precious metals pastes used for microelectronics—Determination of resolution
GB/T 17473.7-1998 Test methods of precious metal pastes used for thick film microelectronics—Test of solderability and solderleaching resistance
GB/T 17473.7-2008 Test methods of precious metals pastes used for microelectronics—Determination of solderability and solderelaching resistance
GB/T 17473.7-2022 Test methods of precious metals pastes used for microelectronics—Part 7:Determination of solderability and solder leaching resistance
Related Standards
GB/T 17168-1997
Replaced
GB/T 17168-1997 Dental casting precious metal alloys
GB/T 4062-1998
Replaced
GB/T 4062-1998 Antimony trioxide
GB/T 13560-2000
Replaced
GB/T 13560-2000 Materials for sintered neodymium iron boron permanent magnets
GB/T 18113-2000
Replaced
GB/T 18113-2000 Heating element of lanthanum chromite in high temperature
GB/T 9967-2001
Replaced