GB/T 17472-2008 Replaced National standards

GB/T 17472-2008 Specification for pastes of precious metal used for microelectronics

GB/T 17472-2008 Specification for pastes of precious metal used for microelectronics

Publish Date: 2008-03-31 Implement Date: 2008-09-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 17472-2008
Standard Type: National standards
Standard Status: Replaced
is_force_gb: no
CCS Name: Precious metals and their alloys
ICS Name: Other non-ferrous metals and their alloys
Publish Date: 2008-03-31
Implement Date: 2008-09-01
Pages: 7 pages

Scope

This standard specifies the product classification, requirements, test methods, inspection rules, and marking, packaging, transportation, and storage of precious metal pastes used in microelectronics technology. This standard applies to sintered and cured precious metal pastes used in microelectronics technology. Non-precious metal pastes can also be implemented in accordance with this standard.

Development Information

Word Count: 10 Thousand words Pages: 7 pages

Replace the following standards

Superseded by the following standards

Referenced Standards

GB/T 6739-1996 Determination of film hardness by pencil test GB/T 6739-2006 Paints and varnishes—Determination of film hardness by pencil test GB/T 6739-2022 Paints and varnishes—Determination of film hardness by pencil test GB/T 13452.2-1992 Paints and varnishes—Determination of film thickness GB/T 13452.2-2008 Paints and varnishes—Determination of film thickness GB/T 17473.1-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of solids content GB/T 17473.1-2008 Test methods of precious metals pastes used for microelectronics—Determination of solids content GB/T 17473.2-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of fineness GB/T 17473.2-2008 Test methods of precious metals pastes used for microelectronics—Determination of fineness GB/T 17473.3-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of sheet resistance GB/T 17473.3-2008 Test methods of precious metals pastes used for microelectronics—Determination of sheet resistance GB/T 17473.4-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of adhesion GB/T 17473.4-2008 Test methods of precious metals pastes used for microelectronics—Determination of adhesion GB/T 17473.5-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of viscosity GB/T 17473.5-2008 Test methods of precious metals pastes used for microelectronics—Determination of viscosity GB/T 17473.6-1998 Test methods of precious metal pastes used for thick-film microelectronics—Determination of resolution GB/T 17473.6-2008 Test methods of precious metals pastes used for microelectronics—Determination of resolution GB/T 17473.7-1998 Test methods of precious metal pastes used for thick film microelectronics—Test of solderability and solderleaching resistance GB/T 17473.7-2008 Test methods of precious metals pastes used for microelectronics—Determination of solderability and solderelaching resistance GB/T 17473.7-2022 Test methods of precious metals pastes used for microelectronics—Part 7:Determination of solderability and solder leaching resistance GB/T 19445-2004 Products of Precious metals and their alloys—Packing marking, transporting and storing

Related Standards

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