GB/T 13840-1992
Abolished
GB/T 17472-2008
Replaced
National standards
GB/T 17472-2008 Specification for pastes of precious metal used for microelectronics
GB/T 17472-2008 Specification for pastes of precious metal used for microelectronics
Basic Information
Standard Code:
GB/T 17472-2008
Standard Type:
National standards
Standard Status:
Replaced
is_force_gb:
no
CCS Name:
Precious metals and their alloys
ICS Name:
Other non-ferrous metals and their alloys
Publish Date:
2008-03-31
Implement Date:
2008-09-01
Pages:
7 pages
Scope
This standard specifies the product classification, requirements, test methods, inspection rules, and marking, packaging, transportation, and storage of precious metal pastes used in microelectronics technology. This standard applies to sintered and cured precious metal pastes used in microelectronics technology. Non-precious metal pastes can also be implemented in accordance with this standard.
Development Information
Replace the following standards
Superseded by the following standards
Referenced Standards
GB/T 6739-1996 Determination of film hardness by pencil test
GB/T 6739-2006 Paints and varnishes—Determination of film hardness by pencil test
GB/T 6739-2022 Paints and varnishes—Determination of film hardness by pencil test
GB/T 13452.2-1992 Paints and varnishes—Determination of film thickness
GB/T 13452.2-2008 Paints and varnishes—Determination of film thickness
GB/T 17473.1-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of solids content
GB/T 17473.1-2008 Test methods of precious metals pastes used for microelectronics—Determination of solids content
GB/T 17473.2-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of fineness
GB/T 17473.2-2008 Test methods of precious metals pastes used for microelectronics—Determination of fineness
GB/T 17473.3-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of sheet resistance
GB/T 17473.3-2008 Test methods of precious metals pastes used for microelectronics—Determination of sheet resistance
GB/T 17473.4-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of adhesion
GB/T 17473.4-2008 Test methods of precious metals pastes used for microelectronics—Determination of adhesion
GB/T 17473.5-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of viscosity
GB/T 17473.5-2008 Test methods of precious metals pastes used for microelectronics—Determination of viscosity
GB/T 17473.6-1998 Test methods of precious metal pastes used for thick-film microelectronics—Determination of resolution
GB/T 17473.6-2008 Test methods of precious metals pastes used for microelectronics—Determination of resolution
GB/T 17473.7-1998 Test methods of precious metal pastes used for thick film microelectronics—Test of solderability and solderleaching resistance
GB/T 17473.7-2008 Test methods of precious metals pastes used for microelectronics—Determination of solderability and solderelaching resistance
GB/T 17473.7-2022 Test methods of precious metals pastes used for microelectronics—Part 7:Determination of solderability and solder leaching resistance
GB/T 19445-2004 Products of Precious metals and their alloys—Packing marking, transporting and storing
Related Standards
GB/T 15677-1995
Replaced
GB/T 15677-1995 Lanthanum metal
GB/T 3136-1995
abolished_transferred
GB/T 3136-1995 Tantalum powders
GB/T 3463-1995
Abolished
GB/T 3463-1995 Tantalum wires
GB/T 3628-1995
Replaced
GB/T 3628-1995 Tantalum and tantalum alloy foils
GB/T 16476-1996
Replaced