MT/T 707-1997
Active
GB/T 15616-2008
Active
National standards
GB/T 15616-2008 Quantitative method for electron probe microanalysis of metals and alloys
GB/T 15616-2008 Quantitative method for electron probe microanalysis of metals and alloys
Basic Information
Standard Code:
GB/T 15616-2008
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Electrochemical, thermochemical, and optical analytical instruments
ICS Name:
Other standards related to analytical chemistry
Publish Date:
2008-08-20
Implement Date:
2009-04-01
Pages:
6 pages
Scope
This standard specifies the method of quantitative analysis of the chemical composition of metals and alloys using an electron probe. This standard is applicable to the micro-area composition analysis of metal and alloy samples at the cubic micron scale, with the range of analyzed elements being from 11Na to 92U. This standard is also applicable to the quantitative analysis of metals and alloys using scanning electron microscopes equipped with spectrometers.
Development Information
Replace the following standards
Referenced Standards
ISO 22309:2006
ISO 22489
ISO/IEC 17025
GB/T 4930-1993 General specification of electron probe microanalysis standard specimen
GB/T 4930-2008 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials(CRMs)
GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials(CRMs)
GB/T 13298-1991 Metal—Inspection method of microstructure
GB/T 13298-2015 Inspection methods of microstructure for metals
GB/T 15074-1994 General guide for EPMA quantitative analysis
GB/T 15074-2008 General guide of quantitative analysis by EPMA
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 15074-2025 General specification for EPMA quantitative analysis
GB/T 20725-2025 Microbeam analysis—Electron probe microanalysis—Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
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GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
GB/T 20725-2006
Active
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 20726-2006
Replaced
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
LY/T 1082-2008
Replaced
LY/T 1082-2008 Test method for analysis of vegetable tannin extracts
LY/T 1083-2008
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