MT/T 707-1997
Active
GB/T 17365-2025
Active
National standards
GB/T 17365-2025 Microbeam analysis—Method of preparation for specimens of metal and alloy in electron probe microanalysis
GB/T 17365-2025 Microbeam analysis—Method of preparation for specimens of metal and alloy in electron probe microanalysis
Basic Information
Standard Code:
GB/T 17365-2025
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Electrochemical, thermochemical, and optical analytical instruments
ICS Name:
Other standards related to analytical chemistry
Publish Date:
2025-03-28
Implement Date:
2025-10-01
Pages:
12 pages
Scope
This document describes the preparation method of metal and alloy bulk samples for electron probe analysis.
This document is applicable to standard samples and specimens used for quantitative analysis by electron probe or scanning electron microscopes equipped with energy dispersive spectrometers or wave spectrometers.
This document is not suitable for preparing specimens with a particle size of less than 5 μm or a thickness of less than 4 μm.
Development Information
Replace the following standards
Referenced Standards
GB/T 4296-2004 Inspection method for microstructure of wrought magnesium alloy
GB/T 4296-2022 Inspection method for microstructure of wrought magnesium alloy
GB/T 4930-1993 General specification of electron probe microanalysis standard specimen
GB/T 4930-2008 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials(CRMs)
GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials(CRMs)
GB/T 13298-1991 Metal—Inspection method of microstructure
GB/T 13298-2015 Inspection methods of microstructure for metals
GB/T 15074-1994 General guide for EPMA quantitative analysis
GB/T 15074-2008 General guide of quantitative analysis by EPMA
GB/T 15074-2025 General specification for EPMA quantitative analysis
Related Standards
GB/T 20724-2006
Replaced
GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
GB/T 20725-2006
Active
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 20726-2006
Replaced
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
LY/T 1082-2008
Replaced
LY/T 1082-2008 Test method for analysis of vegetable tannin extracts
LY/T 1083-2008
Replaced