GB/T 4298-1984
Abolished
GB/T 47239.9-2026
Active
National standards
GB/T 47239.9-2026 Semiconductor devices—Flexible and stretchable semiconductor devices—Part 9:Performance testing methods of one transistor and one resistor(1T1R) resistive memory cells
GB/T 47239.9-2026 Semiconductor devices—Flexible and stretchable semiconductor devices—Part 9:Performance testing methods of one transistor and one resistor(1T1R) resistive memory cells
Price:
$ 49.00
Basic Information
Standard Code:
GB/T 47239.9-2026
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Microcircuit
ICS Name:
Other discrete semiconductor devices
Publish Date:
2026-02-27
Implement Date:
2026-09-01
Pages:
20 pages
Scope
This document describes the performance testing method for a transistor-resistor (1T1R) resistive memory cell. The performance tested by the performance testing method in this document includes read, electrical preprocessing, set, reset, durability, and retention.
This document is applicable to flexible and rigid resistive memory devices, and is not limited by the device's process or size.
Development Information
Same series standard
Adopt standards
IEC 62951-9:2022
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