GB/T 7999-2015 Active National standards

GB/T 7999-2015 Optical emission spectrometric analysis method of aluminum and aluminum alloys

Publish Date: 2015-09-11 Implement Date: 2016-04-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 7999-2015

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Analysis methods for light metals and their alloys

ICS Name: Comprehensive Testing of Metal Materials

Publish Date: 2015-09-11

Implement Date: 2016-04-01

Pages: 8 pages

Scope

This standard specifies the photoelectric direct reading emission spectrometry method for analyzing alloying elements and impurities in aluminum and aluminum alloys. This standard is applicable to the simultaneous determination of 28 elements in aluminum and aluminum alloys, including antimony, arsenic, barium, beryllium, bismuth, boron, cadmium, calcium, cerium, chromium, copper, gallium, iron, lead, lithium, magnesium, manganese, nickel, phosphorus, scandium, silicon, sodium, strontium, tin, titanium, vanadium, zinc, and zirconium. The measurement range is shown in Table 1.

Development Information

Word Count: 14 Thousand words Pages: 8 pages

Replace the following standards

GB/T 7999-2007 Optical emission spectrometric analysis method of aluminum and aluminum alloys

Referenced Standards

GB/T 8170-1987 Rules for rounding off of numberical values GB/T 8170-2008 Rules of rounding off for numerical values & expression and judgement of limiting values GB/T 17432-1998 Methods of sampling for analysing the chemical composition of wrought aluminum and aluminum alloy GB/T 17432-2012 Methods for sampling for analyzing the chemical composition of wrought aluminum and aluminum alloys

Related Standards

GB/T 14140.1-1993 Replaced

GB/T 14140.1-1993 Silicon slices and wafers—Measuring of diameter—Optical projecting method

Publish Date: 1993-02-06

GB/T 14140.2-1993 Replaced

GB/T 14140.2-1993 Silicon slices and wafers—Measuring of diameter—Micrometer method

Publish Date: 1993-02-06

GB/T 15615-1995 Abolished

GB/T 15615-1995 Test method for measuring flexure strength of silicon slices

Publish Date: 1995-07-12

GB/T 16481-1996 Abolished

GB/T 16481-1996 Standard spectrum tables of microwave plasma torch-atomic emitting spectrum of rare earth

Publish Date: 1996-07-09

GB/T 1550-1997 Replaced

GB/T 1550-1997 Standard methods for measuring conductivity type of extrinsic semiconducting materials

Publish Date: 1997-06-03

GB/T 1553-1997 Replaced

GB/T 1553-1997 Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay

Publish Date: 1997-06-03