GB/T 14264-1993
Replaced
GB/T 4937.41-2026
Active
National standards
GB/T 4937.41-2026 Semiconductor devices—Mechanical and climatic test methods—Part 41:Test method for reliability of non-volatile memory devices
GB/T 4937.41-2026 Semiconductor devices—Mechanical and climatic test methods—Part 41:Test method for reliability of non-volatile memory devices
Price:
$ 66
Basic Information
Standard Code:
GB/T 4937.41-2026
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor discrete devices
ICS Name:
Integrated Components of Semiconductor Devices
Publish Date:
2026-02-27
Implement Date:
2026-09-01
Pages:
20 pages
Scope
This document establishes the procedures for conducting effective durability, data retention, and cross-temperature tests on non-volatile memory (hereinafter referred to as "devices") in accordance with the qualification standards. The qualification requirements for durability and data retention (regarding cycle count, retention time, temperature, and sample size) refer to the methods in JESD47 or similar standards such as JESD94.
Development Information
Same series standard
Referenced Standards
IEC 60749-6
IEC 60749-23
Adopt standards
IEC 60749-41:2020
Related Standards
GB/T 14844-1993
Replaced
GB/T 14844-1993 Designations of semiconductor materials
GB/T 17573-1998
Active
GB/T 17573-1998 Semiconductor devices Discrete devices and integrated circuits Part 1:General
GB/T 12560-1999
Active
GB/T 12560-1999 Semiconductor devices Sectional specification for discrete devices
GB/T 11499-2001
Active
GB/T 11499-2001 Letter symbols for discrete semiconductor devices
GB/T 20521-2006
Active