GB/T 4855-1984
Abolished
GB/T 42968.3-2025
Active
National standards
GB/T 42968.3-2025 Integrated circuits—Measurement of electromagnetic immunity—Part 3:Bulk current injection (BCI) method
GB/T 42968.3-2025 Integrated circuits—Measurement of electromagnetic immunity—Part 3:Bulk current injection (BCI) method
Price:
$ 50.00
Basic Information
Standard Code:
GB/T 42968.3-2025
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor integrated circuits
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2025-12-02
Implement Date:
2025-12-02
Pages:
24 pages
Scope
This document describes a test method for measuring the immunity of integrated circuits (ICs) to conducted radio frequency (RF) interference in the presence of RF interference, such as conducted RF interference caused by radiated RF interference. This method is only applicable to ICs with external board connections, such as those connected to cable bundles. This test method injects RF current into one or a group of cables.
This document establishes a common basis for evaluating semiconductor devices in devices when they operate in an environment of unwanted RF electromagnetic waves.
Development Information
Same series standard
Referenced Standards
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished