GB/T 47239.8-2026 Active National standards

GB/T 47239.8-2026 Semiconductor devices—Flexible and stretchable semiconductor devices—Part 8:Test method for stretchability,flexibility and stability of flexible resistive memory

GB/T 47239.8-2026 Semiconductor devices—Flexible and stretchable semiconductor devices—Part 8:Test method for stretchability,flexibility and stability of flexible resistive memory

Publish Date: 2026-02-27 Implement Date: 2026-09-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us
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Basic Information

Standard Code: GB/T 47239.8-2026
Standard Type: National standards
Standard Status: Active
is_force_gb: no
CCS Name: Microcircuit
ICS Name: Other discrete semiconductor devices
Publish Date: 2026-02-27
Implement Date: 2026-09-01
Pages: 16 pages

Scope

This document describes the terminology and testing methods used to evaluate the extensibility, flexibility, and stability of flexible resistive memory, including the test process and the equipment used. This document also includes general requirements for test conditions such as environmental temperature and relative humidity. The testing methods described in this document focus on evaluating stability rather than reliability.

Development Information

Word Count: 23 Thousand words Pages: 16 pages

Same series standard

Adopt standards

IEC 62951-8:202

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