GA/T 2078-2023 Forensic sciences—Sample preparation methods for solid evidence—Ion beam milling
This document specifies the methods of sampling solid evidence using ion beam sectioning and ion beam planar etching in the field of forensic science.
This document is applicable to the sectioning and sampling of solid evidence such as powdered materials, multi-layered paint chips, and polymer films in the field of forensic science that require sectional analysis, as well as the planar etching of metal and alloy evidence for planar detection and analysis. Other fields can also refer to and use this document for similar purposes.