GB/T 4855-1984
Abolished
GB/T 44937.5-2025
Pending
National standards
GB/T 44937.5-2025 Integrated circuits—Measurement of electromagnetic emissions— Part 5:Measurement of conducted emissions—Workbench Faraday Cage method
GB/T 44937.5-2025 Integrated circuits—Measurement of electromagnetic emissions— Part 5:Measurement of conducted emissions—Workbench Faraday Cage method
Basic Information
Standard Code:
GB/T 44937.5-2025
Standard Type:
National standards
Standard Status:
Pending
is_force_gb:
no
CCS Name:
Semiconductor integrated circuits
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2025-12-31
Implement Date:
2026-07-01
Publisher:
国家市场监督管理总局、国家标准化管理委员会
Technical Committee:
全国集成电路标准化技术委员会(SAC/TC 599)
Pages:
24 pages
Scope
本文件描述了安装在标准化试验板或其最终应用的印制电路板（PCB）上的集成电路（IC）的传导电磁发射测量工作台法拉第笼法。
本文件适用于在物理尺寸小的试验板上使用的能执行“独立”功能的IC。
Development Information
Drafting Units:
中国电子技术标准化研究院、北京智芯微电子科技有限公司、中山大学、天津先进技术研究院、厦门海诺达科学仪器有限公司、青岛市产品质量检验研究院、北京国家新能源汽车技术创新中心有限公司、北京邮电大学、北京无线电计量测试研究所、江苏省计量科学研究院(江苏省能源计量数据中心)、中国信息通信研究院、博鼎实华(北京)技术有限公司、中国汽车工程研究院股份有限公司、中国合格评定国家认可中心、长沙芯连心智慧系统有限责任公司、中家院(北京)检测认证有限公司、河北工业大学、北京福测电子仪器有限公司、苏州菲利波电磁技术有限公司
Drafting Persons:
崔强、李志鹏、方文啸、吴建飞、王沛栋、付君、赵扬、朱赛、梁吉明、雷黎丽、石丹、孙美秋、刘星汛、周雷、王紫任、刘宝殿、谭泽强、刘佳、李彦鹏、徐新、王蒙军、兰德福、崔培宾
Same series standard
GB/T 44937.1-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 1:General conditions and definitions
GB/T 44937.2-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 2:Measurement of radiated emissions—TEM cell and wideband TEM cell method
GB/T 44937.3-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 3:Measurement of radiated emissions—Surface scan method
GB/T 44937.6-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 6:Measurement of conducted emissions—Magnetic probe method
GB/T 44937.8-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 8:Measurement of radiated emissions—IC stripline method
Referenced Standards
GB/T 2900.74-2008 Electrotechnical terminology—Circuit theory
GB/T 4365-2003 Electrotechnical terminology—Electromagnetic compatibility
GB/T 4365-2024 Electrotechnical terminology—Electromagnetic compatibility
GB/T 44937.1-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 1:General conditions and definitions
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished