GB/T 4855-1984
Abolished
GB/T 44937.8-2025
Pending
National standards
GB/T 44937.8-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 8:Measurement of radiated emissions—IC stripline method
GB/T 44937.8-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 8:Measurement of radiated emissions—IC stripline method
Basic Information
Standard Code:
GB/T 44937.8-2025
Standard Type:
National standards
Standard Status:
Pending
is_force_gb:
no
CCS Name:
Semiconductor integrated circuits
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2025-12-31
Implement Date:
2026-07-01
Publisher:
国家市场监督管理总局、国家标准化管理委员会
Technical Committee:
全国集成电路标准化技术委员会(SAC/TC 599)
Pages:
20 pages
Scope
本文件描述了使用带状线测量集成电路（IC）电磁辐射发射的方法。被评估IC安装在IC带状线结构的有效导体和地平面之间的EMC试验板（PCB）上。
Development Information
Drafting Units:
中国电子技术标准化研究院、天津先进技术研究院、北京智芯微电子科技有限公司、海研芯(青岛)微电子有限公司、厦门海诺达科学仪器有限公司、广州市诚臻电子科技有限公司、工业和信息化部电子第五研究所、中国汽车工程研究院股份有限公司、浙江诺益科技有限公司、深圳市中兴微电子技术有限公司、中山大学、北京国家新能源汽车技术创新中心有限公司、上海机动车检测认证技术研究中心有限公司、北京无线电计量测试研究所、天津大学、中国信息通信研究院、长沙芯连心智慧系统有限责任公司、河南省电子信息产品质量检验技术研究院、广州广电计量检测(上海)有限公司、思科系统(中国)研发有限公司、福州物联网开放实验室有限公司、北京中电华大电子设计有限责任公司、中家院(北京)检测认证有限公司、中国合格评定国家认可中心、亚锐檀桐检测技术(上海)有限公司、国网电力科学研究院有限公司
Drafting Persons:
付君、崔强、靳冬、吴建飞、乔磊、王新才、方文啸、朱赛、徐蛟、叶畅、梁吉明、李楠、褚瑞、黄雪梅、郑益民、陈梅双、龙发明、吴倩、王晓迪、刘星汛、臧琦、王紫任、李彦鹏、冯星辉、江峰、楼建全、赖秋辉、连恒兴、焦璨、刘佳、邓勇、鞠文静
Same series standard
GB/T 44937.1-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 1:General conditions and definitions
GB/T 44937.2-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 2:Measurement of radiated emissions—TEM cell and wideband TEM cell method
GB/T 44937.3-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 3:Measurement of radiated emissions—Surface scan method
GB/T 44937.5-2025 Integrated circuits—Measurement of electromagnetic emissions— Part 5:Measurement of conducted emissions—Workbench Faraday Cage method
GB/T 44937.6-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 6:Measurement of conducted emissions—Magnetic probe method
Referenced Standards
IEC 60050-131
IEC 60050-161
IEC 61967-1
IEC 61000-4-20
Adopt standards
IEC 61967-8:2023
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished