GB/T 44937.8-2025 Active National standards

GB/T 44937.8-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 8:Measurement of radiated emissions—IC stripline method

Publish Date: 2025-12-31 Implement Date: 2026-07-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: GB/T 44937.8-2025

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Semiconductor integrated circuits

ICS Name: Integrated circuits, microelectronics

Publish Date: 2025-12-31

Implement Date: 2026-07-01

Pages: 20 pages

Scope

This document describes a method of measuring the electromagnetic radiation emission of integrated circuits (ICs) using strip lines. The IC being evaluated is mounted on an EMC test board (PCB) between the effective conductor and the ground plane of the IC strip line structure.

Development Information

Word Count: 23 Thousand words Pages: 20 pages

Same series standard

GB/T 44937.1-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 1:General conditions and definitions GB/T 44937.2-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 2:Measurement of radiated emissions—TEM cell and wideband TEM cell method GB/T 44937.3-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 3:Measurement of radiated emissions—Surface scan method GB/T 44937.5-2025 Integrated circuits—Measurement of electromagnetic emissions— Part 5:Measurement of conducted emissions—Workbench Faraday Cage method GB/T 44937.6-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 6:Measurement of conducted emissions—Magnetic probe method

Referenced Standards

IEC 60050-131 IEC 60050-161 IEC 61967-1 IEC 61000-4-20

Adopt standards

IEC 61967-8:2023

Related Standards

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