GB/T 44937.1-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 1:General conditions and definitions

Scope

This document provides general information and definitions for the measurement of conducted and radiated electromagnetic emissions from integrated circuits, along with descriptions of test conditions, test equipment, test setups, test procedures, and test report content. Appendix A provides a comparison table of test methods to assist in selecting the appropriate measurement method. The purpose of this document is to describe general conditions and establish a unified testing environment for quantitatively measuring radio frequency (RF) disturbances from integrated circuits (ICs). This document describes key parameters that affect test results. Any deviations from the descriptions in this document must be clearly noted in the test report. Measurement results can be used for product comparisons or other purposes. By measuring the radiated RF disturbances or conducted RF emissions from ICs under controlled conditions, information about possible RF disturbances during IC application can be obtained. Each part of IEC 61967 specifies the applicable frequency range.

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