GB/T 4855-1984
Abolished
GB/T 35086-2018
Active
National standards
GB/T 35086-2018 General specification for MEMS electric field sensor
GB/T 35086-2018 General specification for MEMS electric field sensor
Basic Information
Standard Code:
GB/T 35086-2018
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Microcircuit
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2018-05-14
Implement Date:
2018-12-01
Pages:
16 pages
Scope
This standard specifies the raw materials, structural components, technical requirements, test items and methods, inspection rules, packaging, storage, and transportation of MEMS electric field sensors (hereinafter referred to as "sensors").
This standard applies to the development, production, and procurement of MEMS electric field sensors. Other types of electric field sensors can be used as reference.
Development Information
Referenced Standards
GB/T 2423.1-2008 Environmental testing for electric and electronic products—Part 2:Test methods—Tests A:Cold
GB/T 2423.2-2008 Environmental testing for electric and electronic products—Part 2:Test methods—Tests B:Dry heat
GB/T 2423.22-2012 Environmental testing—Part 2:Test methods—Test N:Change of temperature
GB/T 17626.2-2006 Electromagnetic compatibility—Testing and measurement techniques—Electrostatic discharge immunity test
GB/T 18459-2001 Methods for calculating the main static performance specifications of transducers
GB/T 191-2000 Packaging—Pictorial marking for handling of goods
GB/T 191-2008 Packaging—Pictorial marking for handling of goods
GB/T 2423.4-1993 Basic environmental testing procedures for electric and electronic products—Test Db:Damp heat, cyclic
GB/T 2423.4-2008 Environmental testing for electric and electronic products—Part 2:Test method—Test Db:Damp heat,cyclic(12 h+12 h cycle)
GB/T 2423.5-1995 Environmental testing for electric and electronic products—Part 2:Test methods—Test Ea and guidance:Shock
GB/T 2423.5-2019 Environmental testing—Part 2:Test methods—Test Ea and guidance:Shock
GB/T 2423.10-1995 Environmental testing for electric and electronic products—Part 2:Test methods—Test Fc and guidance:Vibration (Sinusoidal)
GB/T 2423.10-2008 Environmental testing for electric and electronic products—Part 2:Tests methods Test Fc:Vibration(sinusoidal)
GB/T 2423.10-2019 Environmental testing—Part 2:Tests methods—Test Fc:Vibration(sinusoidal)
GB/T 2423.16-1999 Environmental testing for electric and electronic products—Part 2:Tests methods—Test J and guidance:Mould growth
GB/T 2423.16-2008 Environmental testing for electric and electronic products—Part 2:Test methods—Test J and guidance:Mold growth
GB/T 2423.16-2022 Environmental testing—Part 2:Test methods—Test J and guidance:Mould growth
GB/T 2423.17-1993 Basic environmental testing procedures for electric and electronic products Test Ka:Salt mist
GB/T 2423.17-2008 Environmental testing for electric and electronic products—Part 2:Test methods—Test Ka:Salt mist
GB/T 2423.17-2024 Environmental testing—Part 2:Test methods—Test Ka:Salt mist
GB/T 2423.21-1991 Basic environmental testing procedures for electric and electronic products—Test M:Low air pressure
GB/T 2423.21-2008 Environmental testing for electric and electronic products—Part 2:Test methods—Test M:Low air pressure
GB/T 2828.1-2003 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection
GB/T 2828.1-2012 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection
GB/T 26111-2010 Micro-electromechanical system technology—Terms
GB/T 26111-2023 Micro-electromechanical system technology—Terms
GB/T 191-2025 Graphical symbols marking for handling and storage of packages
GB/T 2423.21-2025 Environmental testing—Part 2:Test methods—Test M:Low air pressure
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished