YS/T 724-2016 Active Industry standards-Non-ferrous metals

YS/T 724-2016 Silicon power for polycrystalline

YS/T 724-2016 Silicon power for polycrystalline

Publish Date: 2016-07-11 Implement Date: 2017-01-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: YS/T 724-2016

Standard Type: Industry standards

Standard Status: Active

is_force_gb: no

CCS Name: Element semiconductor materials

ICS Name: Semiconductor materials

Publish Date: 2016-07-11

Implement Date: 2017-01-01

Pages: 10 pages

Scope

This standard specifies the requirements for silicon powder used in the production of polysilicon, including testing methods, inspection rules, marking, packaging, transportation, storage, quality certificates, and the content of purchase orders (or contracts).
This standard applies to silicon powder used in the production of polysilicon.

Development Information

Word Count: 18 Thousand words Pages: 10 pages

Replace the following standards

YS/T 724-2009 Metallurgical silicon powder

Referenced Standards

GB/T 22555-2010 Acceptance sampling plans and procedures for the inspection of bulk materials SEMI PV64-0715 GB/T 1480-1995 Determination of particle size for metallic powders—Dry sieving GB/T 1480-2012 Metallic powders—Determination of particle size by dry sieving GB/T 6284-1986 Chemical products for industrial use—General method for determination of water content—Gravimetric method GB/T 6284-2006 Chemical products for industrial use—General method for determination of water content—The loss of mass on drying method GB/T 14849.1-1993 Silicon metal—Determination of iron content—1,10-Phenanthroline spectrophotometric method GB/T 14849.1-2007 Methods for chemical analysis of silicon metal—Part 1:Determination of iron content—1,10-Phenanthrolion spectrophotometric method GB/T 14849.1-2020 Methods for chemical analysis of silicon metal—Part 1:Determination of iron content GB/T 14849.2-1993 Silicon metal—Determination of aluminum content—Chrome azurol S spectrophotometric method GB/T 14849.2-2007 Methods for chemical analysis of silicon metal—Part 2:Determination of aluminum content—Chrome azurol S spectrophotometric method GB/T 14849.3-1993 Silicon metal—Determination of calcium content GB/T 14849.3-2007 Methods for chemical analysis of silicon metal—Part 3:Determination of calcium content GB/T 14849.3-2020 Methods for chemical analysis of silicon metal—Part 3:Determination of calcium content GB/T 14849.4-2008 Methods for chemical analysis of silicon metal—Part 4:Determination of elements content Inductively coupled plasma atomic emission spectrometric method GB/T 14849.4-2014 Methods for chemical analysis of silicon metal—Part 4:Determination of impurity contents—Inductively coupled plasma atomic emission spectrometric method GB/T 14849.5-2010 Chemical analysis of slion metal—Part 5:Determination of elements content—Analysis using an X-ray fluorescence method GB/T 14849.5-2014 Methods for chemical analysis of silicon metal—Part 5:Determination of impurity contents—X-ray fluorescence method GB/T 14849.6-2014 Methods for chemical analysis of silicon metal—Part 6:Determination of carbon—Infrared absorption method GB/T 1480-2025 Metallic powders—Determination of particle size by dry sieving

Related Standards

GB/T 11093-1989 Replaced

GB/T 11093-1989 Liquid encapsulated czochralski-grown gallium arsenide single crystals and As-cut slices

Publish Date: 1989-03-31

GB/T 13388-1992 Replaced

GB/T 13388-1992 Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques

Publish Date: 1992-02-19

GB/T 13389-1992 Replaced

GB/T 13389-1992 Practice for conversion between resistivity and dopant density for boron-doped and phosphorus-doped silicon

Publish Date: 1992-02-19

GB/T 13843-1992 Abolished

GB/T 13843-1992 Polished monocrystalline sapphire substrates

Publish Date: 1992-12-28

GB/T 14015-1992 Active

GB/T 14015-1992 Silicon on sapphire epitaxial wafers

Publish Date: 1992-12-28

GB/T 14139-1993 Replaced

GB/T 14139-1993 Silicon epitaxial wafers

Publish Date: 1993-02-06