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GB/T 16595-1996 Replaced National standards

GB/T 16595-1996 Specification for a universal wafer grid

GB/T 16595-1996 Specification for a universal wafer grid

Publish Date: 1996-11-04 Implement Date: 1997-04-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 16595-1996
Standard Type: National standards
Standard Status: Replaced
is_force_gb: no
CCS Name: Element semiconductor materials
ICS Name: Semiconductor materials
Publish Date: 1996-11-04
Implement Date: 1997-04-01
Pages: 6 pages

Development Information

Word Count: 10 Thousand words Pages: 6 pages

Superseded by the following standards

GB/T 16595-2019 Specification for a universal wafer grid

Referenced Standards

GB/T 1554-1995 Test method for crystallographic perfection of silicon by preferential etch techniques GB/T 6624-1995 Standard method for measuring the surface quality of polished silicon slices by visual inspection GB/T 12964-1991 GB/T 14139-93 GB/T 14142-93 GB/T 14264-93 YS/T 209-94

Adopt standards

SEMI M17-1990

Related Standards

GB/T 11093-1989 Replaced

GB/T 11093-1989 Liquid encapsulated czochralski-grown gallium arsenide single crystals and As-cut slices

Publish Date: 1989-03-31
GB/T 13388-1992 Replaced

GB/T 13388-1992 Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques

Publish Date: 1992-02-19
GB/T 13389-1992 Replaced

GB/T 13389-1992 Practice for conversion between resistivity and dopant density for boron-doped and phosphorus-doped silicon

Publish Date: 1992-02-19
GB/T 13843-1992 Abolished

GB/T 13843-1992 Polished monocrystalline sapphire substrates

Publish Date: 1992-12-28
GB/T 14015-1992 Active

GB/T 14015-1992 Silicon on sapphire epitaxial wafers

Publish Date: 1992-12-28
GB/T 14139-1993 Replaced

GB/T 14139-1993 Silicon epitaxial wafers

Publish Date: 1993-02-06
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