GB/T 13536-1992
Replaced
GB/T 30110-2013
Active
National standards
GB/T 30110-2013 Measuring methods of parameters of HgCdTe epilayers used for space infrared detectors
GB/T 30110-2013 Measuring methods of parameters of HgCdTe epilayers used for space infrared detectors
Basic Information
Standard Code:
GB/T 30110-2013
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semi-metals and semiconductor materials
ICS Name:
Electric equipment and systems for aerospace applications
Publish Date:
2013-12-17
Implement Date:
2014-05-15
Pages:
34 pages
Scope
This standard specifies the test methods and test equipment requirements for the performance parameters of HgCdTe epitaxial materials used in space infrared detectors.
This standard is applicable to the parameter testing of HgCdTe epitaxial materials used in space infrared detectors. The parameter testing of HgCdTe epitaxial materials for other applications can be used as a reference.
Development Information
Referenced Standards
GB/T 1553-2009 Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay
GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
GB/T 4326-2006 Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient
GJB 548B-2005
GJB 1485
GJB 2712
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