GB/T 11093-1989
Replaced
GB/T 29055-2019
Active
National standards
GB/T 29055-2019 Multicrystalline silicon wafers for photovoltaic solar cell
GB/T 29055-2019 Multicrystalline silicon wafers for photovoltaic solar cell
Basic Information
Standard Code:
GB/T 29055-2019
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Element semiconductor materials
ICS Name:
Semiconductor materials
Publish Date:
2019-06-04
Implement Date:
2020-05-01
Publisher:
国家市场监督管理总局、中国国家标准化管理委员会
Technical Committee:
全国半导体设备和材料标准化技术委员会(SAC/TC 203)、全国半导体设备和材料标准化技术委员会材料分技术委员会(SAC/TC 203/SC 2)
Pages:
7 pages
Scope
本标准规定了太阳能电池用多晶硅片（以下简称硅片）的要求、试验方法、检验规则、标志、包装、运输、贮存、质量证明书及订货单（或合同）内容。
本标准适用于太阳能电池用铸造多晶硅片（包括类单晶硅片）。
Development Information
Drafting Units:
江苏协鑫硅材料科技发展有限公司、镇江仁德新能源科技有限公司、江西赛维LDK太阳能高科技有限公司、宜昌南玻硅材料有限公司、有色金属技术经济研究院、扬州荣德新能源科技有限公司、苏州协鑫光伏科技有限公司、英利能源(中国)有限公司
Drafting Persons:
万跃鹏、唐骏、游达、林清香、苏磊、李素青、余刚、高长昆、常传波、李建敏、何亮、梁学勤、齐灵燕、孙培亚、李英叶
Replace the following standards
Referenced Standards
GB/T 2828.1-2012 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection
GB/T 1550-1997 Standard methods for measuring conductivity type of extrinsic semiconducting materials
GB/T 1550-2018 Test methods for conductivity type of extrinsic semiconducting materials
GB/T 6616-1995 Test method for measuring resistivity of semiconductor silicon or sheet resistance of semiconductor films with a noncontact eddy-current gage
GB/T 6616-2009 Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge
GB/T 6616-2023 Test method for resistivity of semiconductor wafers and sheet resistance of semiconductor films—Noncontact eddy-current gauge
GB/T 6618-1995 Test method for thickness and total thickness variation of silicon slices
GB/T 6618-2009 Test method for thickness and total thickness variation of silicon slices
GB/T 6619-1995 Test methods for bow of silicon slices
GB/T 6619-2009 Test methods for bow of silicon wafers
GB/T 14264-1993 Semiconductor materials—Terms and definitions
GB/T 14264-2009 Semiconductor materials—Terms and definitions
GB/T 14264-2024 Terminology of semiconductor materials
GB/T 29054-2012 Solar-grade casting multi-crystalline silicon brick
GB/T 29054-2019 Casting multicrystalline silicon brick for photovoltaic solar cell
GB/T 30860-2014 Test methods for surface roughness and saw mark of silicon wafers for solar cells
GB/T 30869-2014 Test method for thickness and total thickness variation of silicon wafers for solar cell
YS/T 28-1992 Silicon wafer packaging
YS/T 28-2015 Package of silicon wafers
SJ/T 11627-2016 The online testing method for the resistivity of silicon wafers used in solar cells
SJ/T 11628-2016 The online testing methods for silicon wafer size and electrical characterization for solar cells
SJ/T 11630-2016 SJ/T 11630-2016 Geometric Dimension Test Method for Silicon Substrates Used in Solar Cells
SJ/T 11631-2016 The testing method for surface defects of silicon wafers used in solar cells
SJ/T 11632-2016 Testing method for micro-crack defects in silicon wafers used in solar cells
YS/T 28-2024 YS/T 28-2024 Silicon wafer packaging and labeling
Related Standards
GB/T 13388-1992
Replaced
GB/T 13388-1992 Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques
GB/T 13389-1992
Replaced
GB/T 13389-1992 Practice for conversion between resistivity and dopant density for boron-doped and phosphorus-doped silicon
GB/T 13843-1992
Abolished
GB/T 13843-1992 Polished monocrystalline sapphire substrates
GB/T 14015-1992
Active
GB/T 14015-1992 Silicon on sapphire epitaxial wafers
GB/T 14139-1993
Replaced