GB/T 3656-1983
Replaced
GB/T 1558-2023
Active
National standards
GB/T 1558-2023 Test method for substitutional carbon content in silicon by infrared absorption
GB/T 1558-2023 Test method for substitutional carbon content in silicon by infrared absorption
Price:
$ 50
Basic Information
Standard Code:
GB/T 1558-2023
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Analysis methods for semi-metallic and semiconductor materials
ICS Name:
\nMetal material testing
Publish Date:
2023-12-28
Implement Date:
2024-07-01
Pages:
8 pages
Scope
This document describes the infrared absorption test method for determining the content of substituted carbon atoms in silicon.
This document is applicable to the testing of the content of substituted carbon atoms in p-type silicon single crystals with a resistivity greater than 3 Ω·cm and n-type silicon single crystals with a resistivity greater than 1 Ω·cm (test range at room temperature: 5×1015 cm-3 to the maximum solubility of carbon atoms in silicon; test range when the temperature is below 80 K: not less than 5×1014 cm-3).
Development Information
Replace the following standards
Referenced Standards
GB/T 8170-1987 Rules for rounding off of numberical values
GB/T 8170-2008 Rules of rounding off for numerical values & expression and judgement of limiting values
GB/T 8322-1987 Molecular absorption spectrometry—Terminology
GB/T 8322-2008 Molecular absorption spectrometry—Terminology
GB/T 14264-1993 Semiconductor materials—Terms and definitions
GB/T 14264-2009 Semiconductor materials—Terms and definitions
GB/T 14264-2024 Terminology of semiconductor materials
GB/T 29057-2012 Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy
GB/T 29057-2023 Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy
GB/T 35306-2017 Test method for carbon and oxygen content of single crystal silicon—Low temperature fourier transform infrared spectrometry
GB/T 35306-2023 Determination of carbon and oxygen content in single crystal silicon—Low temperature fourier transform infrared spectrometry method
Related Standards
GB/T 3657-1983
Replaced
GB/T 3657-1983 Measurement method of direct magnetic properties of soft magnetic alloys
GB/T 3849-1983
Replaced
GB/T 3849-1983 Hardmetals—Rockwell hardness (scale A) test method
GB/T 3850-1983
Replaced
GB/T 3850-1983 Impermeable sintered metal materials and hardmetals—determination of density
GB/T 3851-1983
Replaced
GB/T 3851-1983 Hardmetals—determination of transverse rupture strength
GB/T 4326-1984
Replaced