GB/T 12965-1996 Replaced National standards

GB/T 12965-1996 Monocrystalline silicon as cut slices and lapped slices

Publish Date: 1996-11-04 Implement Date: 1997-04-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 12965-1996

Standard Type: National standards

Standard Status: Replaced

is_force_gb: no

CCS Name: Element semiconductor materials

ICS Name: Semiconductor materials

Publish Date: 1996-11-04

Implement Date: 1997-04-01

Pages: 12 pages

Development Information

Word Count: 12 Thousand words Pages: 12 pages

Replace the following standards

GB 12965-1991

Superseded by the following standards

GB/T 12965-2005 Monocrystalline silicon as cut slices and lapped slices

Referenced Standards

GB/T 1552-1995 Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array GB/T 1554-1995 Test method for crystallographic perfection of silicon by preferential etch techniques GB 1556-79 GB 2828-87 GB/T 6618-1995 Test method for thickness and total thickness variation of silicon slices GB/T 6620-1995 Test method for measuring warp on silicon slices by noncontact scanning GB/T 6624-1995 Standard method for measuring the surface quality of polished silicon slices by visual inspection GB 11073-89 GB/T 12962-1996 Monocrystalline silicon GB/T 13387-92 GB 14140-93 GB 14844-93 GB/T 1550-1997 Standard methods for measuring conductivity type of extrinsic semiconducting materials GB/T 1550-2018 Test methods for conductivity type of extrinsic semiconducting materials

Related Standards

GB/T 11093-1989 Replaced

GB/T 11093-1989 Liquid encapsulated czochralski-grown gallium arsenide single crystals and As-cut slices

Publish Date: 1989-03-31

GB/T 13388-1992 Replaced

GB/T 13388-1992 Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques

Publish Date: 1992-02-19

GB/T 13389-1992 Replaced

GB/T 13389-1992 Practice for conversion between resistivity and dopant density for boron-doped and phosphorus-doped silicon

Publish Date: 1992-02-19

GB/T 13843-1992 Abolished

GB/T 13843-1992 Polished monocrystalline sapphire substrates

Publish Date: 1992-12-28

GB/T 14015-1992 Active

GB/T 14015-1992 Silicon on sapphire epitaxial wafers

Publish Date: 1992-12-28

GB/T 14139-1993 Replaced

GB/T 14139-1993 Silicon epitaxial wafers

Publish Date: 1993-02-06