MT/T 707-1997
Active
GB/T 17360-2020
Active
National standards
GB/T 17360-2020 Microbeam analysis—Method of quantitative determination for low contents of silicon and manganese in steels using electron probe microanalyzer
GB/T 17360-2020 Microbeam analysis—Method of quantitative determination for low contents of silicon and manganese in steels using electron probe microanalyzer
Basic Information
Standard Code:
GB/T 17360-2020
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Electronic optics and other physical optical instruments
ICS Name:
Other standards related to analytical chemistry
Publish Date:
2020-06-02
Implement Date:
2021-04-01
Pages:
15 pages
Scope
This standard specifies the calibration curve method for determining the silicon and manganese contents in carbon steel and low-alloy steel (with a mass fraction of iron greater than 95%) using an electron probe. This standard is applicable to electron probe spectrometers, but not to energy spectrometers. Scanning electron microscopes with spectrometers can be used for reference.
Development Information
Replace the following standards
Referenced Standards
GB/T 15247-2008 Microbeam analysis—Electron probe microanalysis—Guidelines for determining the carbon content of steels using calibration curve method
GB/T 4930-1993 General specification of electron probe microanalysis standard specimen
GB/T 4930-2008 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials(CRMs)
GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials(CRMs)
GB/T 13298-1991 Metal—Inspection method of microstructure
GB/T 13298-2015 Inspection methods of microstructure for metals
GB/T 15074-1994 General guide for EPMA quantitative analysis
GB/T 15074-2008 General guide of quantitative analysis by EPMA
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 21636-2008 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary
GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis(EPMA)—Vocabulary
GB/T 27025-2008 General requirements for the competence of testing and calibration laboratories
GB/T 27025-2019 General requirements for the competence of testing and calibration laboratories
GB/T 15074-2025 General specification for EPMA quantitative analysis
GB/T 20725-2025 Microbeam analysis—Electron probe microanalysis—Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
Related Standards
GB/T 20724-2006
Replaced
GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
GB/T 20725-2006
Active
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 20726-2006
Replaced
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
LY/T 1082-2008
Replaced
LY/T 1082-2008 Test method for analysis of vegetable tannin extracts
LY/T 1083-2008
Replaced