YS/T 612-2014 Active Industry standards-Non-ferrous metals

YS/T 612-2014 Paste for solar cells

YS/T 612-2014 Paste for solar cells

Publish Date: 2014-10-14 Implement Date: 2015-04-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: YS/T 612-2014

Standard Type: Industry standards

Standard Status: Active

is_force_gb: no

CCS Name: Precious metals and their alloys

ICS Name: Other non-ferrous metal products

Publish Date: 2014-10-14

Implement Date: 2015-04-01

Pages: 9 pages

Scope

This standard specifies the requirements, test methods, inspection rules, and marking, packaging, transportation, storage, quality certificates, and contract (or order form) content for slurry used in crystalline silicon solar cells.
This standard applies to slurry used in the production of front electrodes, back electrodes, and back field electrodes for crystalline silicon solar cells (hereinafter referred to as slurry).

Development Information

Word Count: 18 Thousand words Pages: 9 pages

Replace the following standards

YS/T 612-2006 Paste for solar cell

Referenced Standards

GB/T 3131-2001 Tin-lead solder GB/T 3131-2020 Tin-lead solder GB/T 17472-1998 Specification for pastes of precious metals GB/T 17472-2008 Specification for pastes of precious metal used for microelectronics GB/T 17472-2022 Specification for pastes of precious metal used for microelectronics GB/T 17473.1-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of solids content GB/T 17473.1-2008 Test methods of precious metals pastes used for microelectronics—Determination of solids content GB/T 17473.2-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of fineness GB/T 17473.2-2008 Test methods of precious metals pastes used for microelectronics—Determination of fineness GB/T 17473.3-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of sheet resistance GB/T 17473.3-2008 Test methods of precious metals pastes used for microelectronics—Determination of sheet resistance GB/T 17473.5-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of viscosity GB/T 17473.5-2008 Test methods of precious metals pastes used for microelectronics—Determination of viscosity GB/T 17473.7-1998 Test methods of precious metal pastes used for thick film microelectronics—Test of solderability and solderleaching resistance GB/T 17473.7-2008 Test methods of precious metals pastes used for microelectronics—Determination of solderability and solderelaching resistance GB/T 17473.7-2022 Test methods of precious metals pastes used for microelectronics—Part 7:Determination of solderability and solder leaching resistance

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