GB/T 4855-1984
Abolished
T/CIE 117-2021
Active
Group standards
T/CIE 117-2021 Mechanical shock test method for MEMS device
T/CIE 117-2021 Mechanical shock test method for MEMS device
Price:
$ 20.00
Basic Information
Standard Code:
T/CIE 117-2021
Standard Type:
Group standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Microcircuit
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2021-11-22
Implement Date:
2022-02-01
Pages:
12 pages
Scope
This document specifies the technical requirements, test procedures, and inspection and evaluation rules for mechanical impact testing of MEMS devices in both unpowered and powered states.
This document is applicable to the development, production, and product qualification and acceptance stages of MEMS devices. Its purpose is to evaluate the impact resistance of MEMS devices when they are subjected to instantaneous mechanical impacts due to momentary forces or sudden changes in their motion states during handling, transportation, and use. The applicable mechanical impact pulse width range is 0.05 ms to 30 ms, and the peak acceleration range is 5g to 30,000g.
Development Information
Referenced Standards
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished