GB/T 13840-1992
Abolished
GB/T 5238-2009
Replaced
National standards
GB/T 5238-2009 Monocrystalline germanium and monocrystalline germanium slices
GB/T 5238-2009 Monocrystalline germanium and monocrystalline germanium slices
Basic Information
Standard Code:
GB/T 5238-2009
Standard Type:
National standards
Standard Status:
Replaced
is_force_gb:
no
CCS Name:
\nRare dispersed metals and their alloys
ICS Name:
Other non-ferrous metals and their alloys
Publish Date:
2009-10-30
Implement Date:
2010-06-01
Pages:
7 pages
Scope
This standard specifies the requirements, test methods, inspection rules, and marking, packaging, transportation, storage, and order form (or contract) content for germanium single crystals and germanium single crystal wafers.
This standard is applicable to germanium single crystals and germanium single crystal wafers used in the production of semiconductor devices, lasers, epitaxial substrates, and other applications.
Development Information
Replace the following standards
Superseded by the following standards
Referenced Standards
GB/T 5254
GB/T 1550-1997 Standard methods for measuring conductivity type of extrinsic semiconducting materials
GB/T 1550-2018 Test methods for conductivity type of extrinsic semiconducting materials
GB/T 1552-1995 Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array
GB/T 1553-1997 Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay
GB/T 1553-2009 Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay
GB/T 1553-2023 Test methods for minority carrier lifetime in bulk silicon and germanium—Photoconductivity decay method
GB/T 2828.1-2003 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection
GB/T 2828.1-2012 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection
GB/T 5252-1985 Germanium monocrystal—Inspection of dislocation etch pit density
GB/T 5252-2006 Germanium monocrystal—Inspection of dislocation etch pit density
GB/T 5252-2020 Test method for dislocation density of monocrystal germanium
Related Standards
GB/T 15677-1995
Replaced
GB/T 15677-1995 Lanthanum metal
GB/T 3136-1995
abolished_transferred
GB/T 3136-1995 Tantalum powders
GB/T 3463-1995
Abolished
GB/T 3463-1995 Tantalum wires
GB/T 3628-1995
Replaced
GB/T 3628-1995 Tantalum and tantalum alloy foils
GB/T 16476-1996
Replaced