GB/T 1550-2018 Test methods for conductivity type of extrinsic semiconducting materials

Scope

This standard specifies the test methods for the conductivity type of non-intrinsic semiconductor materials.
This standard is applicable to the conductivity type testing of silicon and germanium non-intrinsic semiconductor materials. Other non-intrinsic semiconductor materials can refer to this standard for testing. The method of this standard can ensure reliable results for materials with uniform conductivity type; for materials with uneven conductivity type, different conductivity type regions can be measured on their surfaces.
This standard is not applicable to the conductivity type testing of layered structure materials (such as epitaxial wafers).

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